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Presented by: |
Friday, October 16, 2009 at 12 noon
Niskayuna
Reformed Church |
Slides from the presentation now available: Adobe PDF
ABSTRACT
This is a presentation on Reliability Concepts and the application to highly reliable systems found in critical facilities both private and public sectors. It will reaffirm the definitions and provide an example of single cord and dual cord missions. Also discussed are some of the sources of data to assist you in the daily assessment and application of Reliability.
ABOUT THE SPEAKER
Robert G. Arno received his B.S. in Electrical Engineering from State University of New York at Utica/Rome in 1982 and is currently a senior member of IEEE . Mr. Arno has worked in the reliability field for 32 years, and currently is employed by HP Critical Facility Services (HP CFS), In Albany, NY. He currently leads the Intelligence Group at HP CFS servicing the needs of government critical facilities. His principal responsibilities include leading and directing programs and bringing technology to the development of better facilities He is also a contributing author to NFPA NEC code Article 708 and NFPA 70 B.
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DIRECTIONS:
The church is located just west of the intersection of Rosendale/Vly Rd
and Rt. 7, on the corner of Niskayuna Rd and Rt. 7. There is plenty of
parking, accessible from either Rt. 7 or Niskayuna Rd. The meeting will
be in the large white meeting hall next to the church. Enter through the
large glass doors at the lower level. Please note that there is no
smoking allowed anywhere on the church grounds.
Map
to Niskayuna Reformed Church
NOTE: Valley Road = Vly Road
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LUNCH:
Lunch is provided.
RESERVATIONS:
Please contact Lou Tomaino at schdyieee
(at) yahoo.com by Thursday, October 15, 2009 at 9:00 AM to reserve. This
event is free for IEEE members, $5.00 for non-members to help cover the
cost of the room.
Please be courteous and cancel your reservation if you cannot attend so that we have a chance to adjust the food order and seating.
Sponsored by the Industry Applications Society (IAS)