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Randy Wolf and Jing Li, RF Test
Development
IBM Microelectronics
Division, Essex Junction, VT 05452
Tian Xia, Electrical and Computer Engineering University of Vermont Burlington, VT 05405 Wednesday, October
20th, 2004 at 6:30 p.m.
Kalkin 003, University of Vermont (Kalkin is next to Votey and this room is in the basement) FREE PIZZA WILL BE SERVED!
Register with Jim Monzel (jmonzel@ieee.org, 802-769-6428) by Friday, October 15th. Abstract: As the frequency/speed of
ICs becomes higher and higher, more room to budget timing events is
needed and therefore less jitter is required. Jitter measurement is a
hot topic right now, and it will become even more important in the
future. Many papers/articles have been published in the last few years
on this topic. This seminar will give an overview of jitter measurement
in high speed digital signal. It will include the following subjects:
A. Jitter Fundamentals a.
Background on Jitter
b.
Jitter definition and models.
B.
Survey of Jitter Measurement Techniques
a.
Off-chip jitter measurement technique
b. On-chip jitter measurement technique
This is a joint meeting of the IEEE student chapter at UVM and the Green Mountain Computer Society chapter. VT IEEE members are welcome to attend.
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