NEWSLETTER OF
THE
NOVEMBER 2005
The web site for the
IN THIS ISSUE:
1. Signal Processing Society Meeting
Notice
2. Lasers
and Electro-Optics Society Meeting Notice
3. Election
for the 2006 Section Officers
1. Signal Processing Society Meeting Notice
Dr. Janet Rutledge from UMBC will give a presentation of
her work on Monday December 5 at 6:00 PM. The meeting will be held at the
Historical Electronics Museum (HEM) on
2. Lasers and Electro-Optics Society Meeting Notice
The Baltimore Chapter of the Lasers and Electro-Optics Society is pleased to announce the next two speakers in the Chapter’s Technical Seminar Series. The events will be held at The Johns Hopkins University Applied Physics Laboratory in Howard County Room 3 on Wednesday November 2 and 30. A light dinner and refreshments will be served at 6pm followed by a discussion of current and future Chapter activities. The evenings will culminate in captivating technical lectures, beginning at 7pm. As always, new ideas and thoughts for Chapter activities are welcome. Please see below and the Chapter web site www.ieee.org\BaltimoreLEOS for more details.
Speaker:
Dr. Curtis R. Menyuk, Professor of Electrical
Engineering at the University of
Location:
JHU Applied Physics Laboratory Howard County Room 3
Date and Time:
Wednesday, November 2, 2005, 6PM Dinner, 7PM Lecture
Topic:
Partially Polarized Noise in Optical Fiber Communications Systems
Overview:
Polarization
effects such as polarization-dependent loss (PDL), polarization-dependent gain
(PDG), and polarization mode dispersion (PMD) can significantly impact system
performance. When characterizing system
performance, it is important to relate the more fundamental Q-factor to the
more easily measured signal-to-noise ratio (SNR). It is also important to take into account the
realistic optical and electrical filter shapes.
The widely used formulae to relate Q and SNR that can be found in
optical fiber communications textbooks only consider two extreme cases in which
the noise is unpolarized or completely co-polarized with the signal. However, partially polarized noise can occur
in systems with significant PDL. In a
series of recent publications, members of my research group have systematically
investigated the impact of partially polarized noise both theoretically and
experimentally. I will summarize the
results of that research in my presentation.
A key finding is that the relationship between Q and SNR is not unique. As a consequence, Q can vary greatly even
when the SNR does not change.
Meeting Co-Sponsored with
Speaker:
Jim Mollenkopf, Vice President, Architecture and Products, Current Technologies.
Location:
JHU Applied Physics Laboratory Howard County Room 3
Date and Time:
Wednesday, November 30, 2005, 6PM Dinner, 7PM Lecture
Topic:
Broadband over Power Line Technology
Overview (from
Current Technologies web site www.currenttechnologies.com):
Broadband over
Power Line (BPL) technology uses the existing electric wires to provide
symmetric digital communication services at multi-megabit data rates to enable
services such as high-speed Internet access, Voice over Internet Protocol
(VoIP), video, and in-home networking. BPL enables PCs, telephones, and multimedia
devices to exchange information between one another and the Internet and other
networks by simply plugging into existing electrical outlets.
Additionally, BPL
adds intelligence to the electric distribution system, enabling Enhanced Power
Distribution Services (EPDS) such as two-way automated meter reading (AMR),
outage detection, demand side management, power quality management and much
more, resulting in improved electric network reliability, security, and
efficiency as well as increased customer service quality.
3. Election for the 2006 Section Officers
The election for the 2006 Section Officers is being conducted until 21 November. Please check our web site ieee.org/Baltimore and vote now.
4. Senior Membership
Isn't it time you applied to become a senior member. The section will be holding a senior member
application day on Saturday December 10th at the
5.
66th ARFTG Conference
The Automatic RF Techniques Group (ARFTG) Inc. is a not-for-profit
educational organization affiliated
with the MMT-S and IEEE. ARFTG is the premier RF & microwave test
organization celebrating 33
years of excellence. We will be holding our 66th conference in
Presentations:
Invited: "Demonstration of Carbon Nanotube Field Effect Transistor
Operation at 33 GHz"
Authors: Aaron A. Pesetski, James E. Baumgardner,
James Murduck, Erica Folk, John Przybysz, John D. Adam, and Hong Zhang
Invited: “Wide Bandgap
Semiconductors
What are they, how do you identify one, and
what are they good for?”
Authors : Greg DeSalvo and Anders Walker
“Planar Antenna Integrated with Miniaturized Duplexer”
Authors : Haruichi Kanaya, Kewnta Seki, and Keiji Yoshida
“IIP3 Estimation from Gain Compression of RF Power Amplifiers”
Authors : Choongeol Cho, Yus Ko, and William R. Eisenstadt
“Full Matrix Switch Relay Box – A Design Approach”
Author : Branko M. Narancic
“RF Probing of Custom ASICs”
Authors : Bruce Bullard, Sean McNally, and Rich MsNamar
“GaN FET’s Non-Linear Model Constructed by Adaptive Multi-Bias S-Parameter Measurements”
Authors : D. Xiao, D. Schreurs, C van Niekerk, W, De Raedt, J. Derluyn, M. germain, B. Nauwelaers, and G, Borghs
“Time Domain Harmonic Load-Pull of an AlGaN/GaN HEMT”
Authors : Fabian De Groote, Oliver Jardel, Jan Verspecht, Denis Barataud, Jean-Pierre Teyssier, and Raymond Quere
“Calibration Errors When Neglecting Crosstalk”
Author : Leonard Hayden
“Inter-Laboratory Comparison of S-Parameter and Noise Parameter Measurements on CMOS Devices with 0.13 μm Gate Length”
Authors : James Randa, Susan L. Sweeney, Tom McKay, David
K. Walker, David R. Greenberg, Jon
“Statistical Analysis for Accuracy in Noise Figure Measurements”
Author : N. Ortegi, J.M. Collantes, and M. Sayed
“Measuring Nonlinear Devices to Retrieve Good System-Level
Models”
Authors : Ludwig De Locht, Gerd Vanderstyeen, Yves Rolain, and Daan Rabins
“Comparison of Multisine Measurement from Instrumentation Capable of Nonlinear System Characterization”
Authors : Kate A. Remley, David I Bergman, Pauld D. Hale and Darryl Keenan
“Uncertainty Analysis for the 65 GHz Termination Calibrated by Using the Vector Network Analyzer”
Author : Yeou-Song (Brian) Lee
“Technique For
Assessing PNA Measurement Repeatability Using A NIST Standard”
Authors : Nazia
Aki and Brett Grossman
“Measurement-Based Performance Evaluation of WIMAX Transceiver designs”
Authors : Huseyin Arslan and Daljeet Singh
“Hot S-Parameter Techniques: 6 = 4 + 2”
Authors : Jan Verspecht , Jean-Pierre Teyssier, and Denis Barataud
“325 to 500 GHz Vector Network Analyzer System
Authors : Yuenie Lau and Tony Denning
“Constructing and Benchmarking a Pulsed-RF, Pulsed-Bias S-Parameter System”
Authors : Charles P. Baylis II,
Panel Discussion
Session:
High Power Measurements - Challenges and Future Trends
Panel Members :
Included Workshop:
Future of
High-Speed Electrical Waveform Metrology
This workshop will address emerging issues in electrical waveform metrology required to support modern telecommunications and wireless applications. The workshop will focus on new classes of high-bandwidth electrical instruments that must measure both temporal and frequency-domain signals and, because of the high frequencies involved, must be mismatch corrected, magnitude and phase calibrated, and may generate energy beyond connector cutoff frequencies. The workshop will focus on new high-speed oscilloscopes, vector signal analyzers, high-speed pattern generators, bit error rate testers, and large-signal analyzers.
Organizers : Dylan Williams and Paul Hale
Presenters : Jim Mueller (LeCroy), Christopher Silva (The
Aerospace Corp.), & Leonard Hayden (Cascade Microtech)
6. Short Course Announcement
Microwave Measurements for High Performance Devices and Applications
November 29-30,
2005
Do you need to commit this
year’s educational expenses soon? Are you an engineer, technician, or scientist
concerned with accurate measurement of RF and microwave quantities? If so, it
might be worth planning ahead. The Automatic Radio Frequency Techniques Group
(ARFTG) in cooperation with the National Institute of Standards and Technology
(NIST) will offer its 2005 Microwave Measurements Short Course in
David K. Walker
NIST, M.S. 818.01
325 Broadway
Phone: 303-497-5490 FAX: 303-497-3970
E-mail: dwalker@boulder.nist.gov
7. Continuing EE Education
We are re-running this request for interest in a continuing education program. This program will be in the format of seminars focused on a particular topic of interest. The seminars may run either during the week after work hours or possibly on Saturday. The idea for the program is described below.
Name of project: Continuing EE Education (“CEEE”)
Goal: A section-level program aimed at:
Updating the IEEE members on new developments in the EE field.
Familiarizing engineers with basic new tools, products and techniques as well as giving them the initial knowledge and skills to use them.
Inviting representatives from different vendors to present leading novel products.
Giving tutorials in new areas.
Helping IEEE fellow members become more competitive, especially in times of uncertain jobs, off-shoring and salary stagnation.
Facilitating networking.
Broadening the horizon of each IEEE member.
Fostering collaboration between members of different societies as well as generation of new ideas (“cross-pollination” element).
The program should be open to all IEEE members, including students. It is meant to be a cross-societies initiative, i.e. should not be limited to narrow topics serving the interests of a single chapter only. Emphasis should be placed on meeting with experienced experts from different fields. Critical comparisons between different solutions of EE problems are expected to be made, and trends should be discussed.
Potential topics of interest could include, but are not limited to:
Software tools:
Programming languages
Compilers
Real-Time Operating systems
Debuggers
Emulators
Hardware tools:
Novel electronic components
Single-Board Computers (SBC)
Embedded solutions
FPGAs
Printed circuit board design (schematics capture, layout)
Circuit simulation (PSPICE)
Portable devices
Signal and image processing (examples, tools, help)
Wireless devices:
Theory
Standards
Available OEM products
Trends
Internet-based methods and devices:
Standards
Available tools
Contemporary design tools (like AutoCad and Solid Works)
Reliability and Compliance issues
We plan to invite qualified speakers from academia, industry and governmental institutions. The speakers will be professionals who can give first-hand information and share front-line experience on the technology, methods and tools being presented.
We plan to organize 2-4 meetings annually. Each meeting is planned to last for 2 hours or more. We could meet on weekdays, or on Saturdays.
Please send us your suggestions and preferences regarding topics, time and place of meetings, the name/acronym of the program etc.
Boris Gramatikov
Vice Chair,
Bgramat@jhmi.edu
