NEWSLETTER OF
THE
DECEMBER 2006
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The web site for the
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IN THIS ISSUE:
2. Reliability
Society Meeting Notice
3. Power
Engineering Society Gala
4. Power
Electronics Meeting Notice
7. Continuing
EE Education Course
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Topic:
Bridging University to Industry: A Case Study of a Modern Medical Diagnostic Venture
Speaker:
Santosh Venkatesha
Vice President of Finance & Business Development
Infinite Biomedical Technologies (IBT) (a local
Date:
December 7, 2006
Time:
6:00 PM - Food
6:30 PM - Presentation
Location:
Clark Hall 110
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The IEEE Reliability Society,
Topic:
Reliability Block Diagram Modeling - Comparisons of Three Software Packages
Speaker:
Aron Brall, CRE
SRS Technologies
Date:
Wednesday, Dec 13th 2006
Time:
11:30 am
Location:
Northrop Grumman ES
MS 1300-1 Conference Room
(Directions below)
This paper hypothesizes that significant differences may occur between three commercially available Reliability Block Diagram (RBD) modeling tools due to differences in algorithms and simulation methodologies. The authors seek to resolve the correctness of their hypothesis and report the results of the comparison of the three tools.
Pizza and Sodas will be provided
Please RSVP by December 7th
Walt Willing
(410) 765-7372 / (443) 622-3390 (cell)
Sorry, attendees must be US citizens.
Directions to Northrop Grumman:
Take I-95 or I-295 to I-195 East (Toward
South at 3rd light.
Turn Left into Northrop Grumman Parking Lot (GATE 2).
Look for Visitor Parking Spaces.
Please do not park in reserved spaces.
Look for Visitor Entrance and sign in.
We will have escorts to bring you to the Conference Room
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The following is a notice from Dewane A. Daley, Chairman of the Baltimore PES (2006).
The Baltimore Power Engineering Society first annual Gala will
be held on Tuesday, December 5, 2006 at
the
The purpose of the event is to provide a forum for seasoned and young professional engineers from diverse sectors to network, while providing support for our local PES chapter so we can continue to meet the needs of our members and the local area power engineering community. This event also serves as an opportunity to meet with friends who you may not have seen for quite some time.
This Gala promises to be an exciting and entertaining evening for you and your guest. Please put this date on your calendar now, while you make necessary arrangements. Information regarding RSVP and payment method will follow in the next few days. Options will include check and pay pal via the Baltimore PES website. We are also seeking sponsorship for several of our young professionals to be able to attend the event as well. You may sponsor a young professional for $50 or make a donation at whatever level is comfortable for you. You may visit our website at:
http://www.ewh.ieee.org/r2/baltimore/baltimorepes/
We would also like to hear from you if there are any questions. You may reach us by email at baltimorepes@ieee.org.
We look forward to your attendance and support.
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Topic:
Reliability of Power Electronic Modules
Speaker:
Dr. Patrick McCluskey
Date:
December 4, 2006
Time:
6 PM
Location:
Historical
Abstract:
There is an ever
increasing need for advanced electrical power systems that can be used to
control, manage, and distribute power at multiple levels, for applications as
diverse as laptops, hybrid electric vehicles, and power substations. These
advanced electrical power systems rely on solid-state electronic power modules
to improve energy efficiency and reduce dependence on fossil fuels, while
simultaneously reducing system size and weight and improving system performance.
Critical to the widespread incorporation of these solid-state modules, however,
is determining and enhancing their reliability under the harsh environmental (high
temperatures, high humidity, and dust) and operational (high voltages, currents
and power dissipation levels) loading conditions typical of power electronics
applications.
Accelerated
qualification testing, the traditional method for assessing the reliability of
power electronic modules and systems, is time-consuming and costly, and provides little understanding of the
fundamental factors that can be used to design reliability into an electronic
system. This presentation will discuss the application of the PoF (Physics of
Failure) based approach to assess the reliability of both traditional and next
generation power modules. Critical failure sites to be discussed include
wirebond interconnects, flip chip interconnects, die and substrate attach, and
substrates.
Please RSVP to hobrien@arl.army.mil if planning to attend.
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Alumni and friends are invited to join Nicholas P. Jones,
Dean of the Whiting School of Engineering at
Date:
Tuesday, December 5, 2006
Time:
Reception begins at 6:00 p.m.
Location:
Johns
RSVP by Friday, December 1, 2006
(410) 516-8723 or engineering@jhu.edu
The speakers include:
Glen Fountain
New Horizons Project Manager and EPP Instructor
New Horizons is the first mission in NASA’s New Frontiers program of medium class planetary missions. It will be the first spacecraft to visit Pluto and its moon, Charon.
Mark Perry, Ph.D. ’85, ’89 (A&S)
MESSENGER Radio Scientist
MESSENGER is a scientific investigation of the planet Mercury by spacecraft. The name comes from “MErcury Surface, Space ENvironment, GEochemistry, and Ranging,” highlighting the project’s broad range of scientific goals.
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The Eleventh International IEEE EDOC Conference (EDOC
2007) “The Enterprise Computing Conference” will be held in
The EDOC 2007 Organizing Committee is looking for volunteers to work with the committee in support of local arrangements, registration, publications and publicity.
About the conference:
Formerly known as the enterprise distributed object computing conference, EDOC 2007 will be the eleventh event in the series of conferences, which since 1997 has brought together leading computer science researchers, IT decision makers, IT architects, solution designers and practitioners from academia, industry and government to discuss enterprise computing challenges, models and solutions. Enterprise computing is based on a wide (and ever growing) range of methods, models, tools and technologies traversing a broad spectrum of vertical domains and industry segments, from electronic and mobile commerce to real-time business applications for collaborating enterprises.
The EDOC 2007 Conference will emphasize the integration and management of enterprise computing research and development as well as novel implementation approaches and technologies related to business processes integration, management, execution and monitoring at any or all of the business, application, middleware and technical levels.
The main conference will be preceded by two days of
workshops for which a separate call for proposals will be issued. For example, EDOC 2006 workshops included:
VORTE: Vocabularies, Ontologies and Rules for the
Topics:
The EDOC 2007 program will include papers addressing the domains, the life-cycle issues and the realization technologies involved in developing, deploying and operating enterprise computing systems. Topic areas include:
- State of the art in distributed enterprise applications
-
- SW engineering approaches to distributed enterprise applications
- Web services
- Business Process Management (BPM) Systems
- Business Rules
- Identity Management and Distributed Access Control
- Information and Data Integration
Conference Schedule
Abstract submission (optional) 30 March 2007
Paper submission due 1 May 2007
Acceptance notification 30 June 2007
Workshop Schedule
Workshop proposals due 6 April 2007
Workshop selection TBD
Paper submission due TBD
Acceptance notification 30 June 2007
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Title:
Developing Real-Time, Embedded Products
Speaker:
Kim Fowler
Dates:
January 6 and January 13, 2007
Time:
8:45 am to 1:00 pm
Location:
Historical
(Directions below)
Please respond to:
Boris Gramatikov
Chair,
Course Summary:
The course surveys many different concerns that an engineer or designer needs to consider when developing a new product - hardware circuits, software processes, power, cooling, human interfaces, testing, integration, delivery, and support after product launch. It presents many different tradeoffs, such as buy versus build, architectures that suit specific applications, and types of markets.
Short bio:
Kim has spent 25 years in designing and developing medical, military, and satellite equipment. He authored, Electronic Instrument Design: Architecting for the Life Cycle, published by Oxford University Press and is currently working on three other books. He is Editor-In-Chief of the IEEE Instrumentation & Measurement magazine, writes the Tried and True column, and is an IEEE Distinguished Lecturer. He co-founded Stimsoft, a medical products company, which sold in 2003 and now consults in product development. He has published widely in engineering journals and has several patents.
CEU Credits:
THIS COURSE WILL BE ELIGIBLE FOR CEU-CREDITS. Boris has discussed this with Celeste M. Torres, CEU Administrator at IEEE Educational Activities, and is in the process of filing an application. The course will be 2 x 4 hours, on two consecutive Saturdays. Each hour counts as 0.1 CEU (CEU = Continuing Education Units). Also, 0.1 CEU = 1 PDH (Professional Development Hour). The CEU is a currency that measures a person's participation in a formal, non-credit continuing education program, such as a workshop, seminar, tutorial, or self-study course. IEEE is an Authorized CEU Provider through the International Association for Continuing Education and Training (IACET). As defined by IACET, one CEU is equal to ten contact hours of instruction in a continuing education activity. Any activity less than one hour in duration is not eligible for CEUs. Currently, thirty states require Professional Development Hours to maintain P.E. licensure, encouraging engineers to seek CEUs for their participation in Continuing Education programs. Evidence of participation in these courses also helps engineers meet company training requirements.
The Section is expected to cover the cost ($35.00) for the course, and each interested participant who requests CEUs will have to cover the cost of $15.00 for his/her individual certificate.
Potential applicants to the course and CEUs need to register before Dec 22, 2007 by sending an email to Boris at bgramat@jhmi.edu.
Directions to HEM:
The Historical Electronics Museum (HEM) is located near BWI airport. The address for the HEM is:
Historical
410-765-0230
The directions for the HEM are as follows:
From Baltimore:
Route 295 South (Baltimore Washington
Parkway)
Take West Nursery Road exit, turn left
at light and go through four stoplights.
Museum is on the left, next to the
Marriott Hotel.
From
Route 97
Turn right at sixth light onto
Turn right at second light onto
Museum is on the right, next to the
Marriott Hotel.
From
Route 295 North (
Take West Nursery Road exit, stay right
on ramp.
Go through three stoplights.
Museum is on the left, next to the
Marriott Hotel.
From Route 195:
Route 170 North (
Left at first light onto
Left at light onto
Right onto
Museum is on the right next to the
Marriott Hotel.
From Interstate
95:
Exit onto 195 East to 295 North and
follow directions from
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We are re-running this request for interest in a continuing education program. This program will be in the format of seminars focused on a particular topic of interest. The seminars may run either during the week after work hours or possibly on Saturday. The idea for the program is described below.
Name of project: Continuing EE Education (“CEEE”)
Goal: A section-level program aimed at:
Updating the IEEE members on new developments in the EE field.
Familiarizing engineers with basic new tools, products and techniques as well as giving them the initial knowledge and skills to use them.
Inviting representatives from different vendors to present leading novel products.
Giving tutorials in new areas.
Helping IEEE fellow members become more competitive, especially in times of uncertain jobs, off-shoring and salary stagnation.
Facilitating networking.
Broadening the horizon of each IEEE member.
Fostering collaboration between members of different societies as well as generation of new ideas (“cross-pollination” element).
The program should be open to all IEEE members, including students. It is meant to be a cross-societies initiative, i.e. should not be limited to narrow topics serving the interests of a single chapter only. Emphasis should be placed on meeting with experienced experts from different fields. Critical comparisons between different solutions of EE problems are expected to be made, and trends should be discussed.
Potential topics of interest could include, but are not limited to:
Software tools:
Programming languages
Compilers
Real-Time Operating systems
Debuggers
Emulators
Hardware tools:
Novel electronic components
Single-Board Computers (SBC)
Embedded solutions
FPGAs
Printed circuit board design (schematics capture, layout)
Circuit simulation (PSPICE)
Portable devices
Signal and image processing (examples, tools, help)
Wireless devices:
Theory
Standards
Available OEM products
Trends
Internet-based methods and devices:
Standards
Available tools
Web Page Design
Contemporary design tools (like AutoCad and Solid Works)
Reliability and Compliance issues
We plan to invite qualified speakers from academia, industry and governmental institutions. The speakers will be professionals who can give first-hand information and share front-line experience on the technology, methods and tools being presented.
We plan to organize 2-4 meetings annually. Each meeting is planned to last for 2 hours or more. We could meet on weekdays, or on Saturdays.
Please send us your suggestions and preferences regarding topics, time and place of meetings, the name/acronym of the program etc.
Boris Gramatikov
Chair,
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