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ICITA 2004
IEEE Orlando Section
ED/CPMT
(Electron Devices / Components, Packaging,
and Manufacturing Technology)

Meeting Announcement


Unless otherwise stated, non-IEEE members are welcome to attend the meetings listed here. Members are encouraged to invite and bring guests to these events.

IEEE Distinguished Lecture
Electrostatic Discharge (ESD) Protection Structures in Microchips

Date:

Wednesday, September 3, 2003

Time:

TBA (2:00 PM tentative)

Pace:

Room 232, Computer Science Building, UCF

Speaker:

Juin J. Liou, University of Central Florida

Contact:

Anwar Sadat, anwarsadat@ieee.org

Abstract:

Electrostatic discharge (ESD) is a process in which a finite amount of charge is transferred from one object (i.e., human body) to the other (i.e., micro-chip). This process can result in a very high current passing through the microchip within a very short period of time, and more than 35% of chip damages can be attributed to such an event. An overview on the ESD and ESD protection techniques will first be given. This is followed by the development of a compact yet accurate MOS model suitable for SPICE circuit simulation under the ESD event. Finally, the design and optimization of ESD protection structures for radio frequency (RF) applications will be addressed.

Bio:

Juin J. Liou received the B.S. (honors), M.S., and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively. In 1987, he joined the Department of Electrical and Computer Engineering at the University of Central Florida, Orlando, where he is now a Professor. His current research interests are semiconductor device modeling, simulation, reliability, and characterization. Dr. Liou has published six textbooks (another in preparation), more than 180 journal papers (including 12 invited articles), and more than 130 papers (including 35 keynote or invited papers) in international and national conference proceedings. He has been awarded more than $4.5 million of research grants from federal agencies (i.e., NSF DARPA, Navy, Air Force, Army, NIST), state government, and industry (i.e., Semiconductor Research Corp., Intel Corp., Intersil Corp., Lucent Technologies, Texas Instruments, and Lockheed Martin), and has held consulting positions with research laboratories and companies in the United States, Japan, Taiwan, and Singapore. In addition, Dr. Liou serves as a technical reviewer for various journals and publishers, as well as a chair or member of the technical program committee for several international conferences. Currently, he is an associate editor for the Simulation Journal in the area of VLSI and circuit simulation, and a regional editor (in USA, Canada and South America) for the Microelectronics Reliability, an international journal published by Elsevier Science Publisher. Dr. Liou received eight different awards on excellence in teaching and research from the University of Central Florida and four different awards from the IEEE Electron Device Society. In the summer of 1992, 1993, and 1994, Dr. Liou was selected as an Air Force Summer Research Fellow at the Air Force Research Laboratory, Dayton, Ohio, where he conducted research on modeling and reliability of AlGaAs/GaAs heterojunction bipolar transistors. In the Fall of 1997, Dr. Liou took a sabbatical leave and was a Visiting Professor in the Electrical Engineering Dept. at National University of Singapore, Singapore. Dr. Liou is an IEEE EDS Distinguished Lecturer, an IEEE EDS Administrative Committee member, an IEEE Educational Activities Committee member, a senior member of the IEEE, and a courtesy professor of Huazhong University of Science and Technology, China.

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