Date: Tuesday, September 12, 2000 at 6:00 PM
Eaton Corporation - Innovation Center - B Conference Rooms - 2nd Floor 26201 Northwestern Highway Southfield, Michigan 48076
Maps to Eaton may be found at http://www.eaton.com/EMC
Use the Civic Center West Entrance. Look for the white IEEE sign at the door. Take the elevator to the 2nd floor B Conference rooms.
This is a FREE event. Snacks and refreshments will be provided at 5:45 PM.
Please RSVP: S.R.Lytle@IEEE.org with the number of people attending in the subject line or call 248-354-5245
To be added or removed from the e-mailing list, email to S.R.Lytle@IEEE.org with ADD or REMOVE in subject line.
The IEEE Southeastern Michigan EMC Homepage is http://www.ewh.ieee.org/r4/se_michigan/emcs/
Mr. Bosley is an Electromagnetic Compatibility (EMC) Technical Specialist for Visteon's EMC Laboratory at VTC-Dearborn. Mr. Bosley has been with Ford/Visteon for the past 12 years and has made significant contributions to each project within the laboratory and worked in each of the key areas including test equipment hardware design, test software, documentation, gauge capability studies and personnel training. Mr. Bosley's accomplishments include the automation of new Radiated Emissions and Radiated Immunity tests, new Conducted Immunity tests and test facilities, new transducer and data acquisition methods and has made two invention disclosures.
Mr. Bosley is currently an active member in the IEEE/EMC and EOS/ESD societies and contributes to the SAE EMI/EMR committees.
The Ford/Visteon component EMC specification has developed over many years with efforts from many dedicated people. The requirement adopts international requirements and methods from ISO and CISPR where possible as well as unique tests to help avoid some very specific real world concerns. For each test , there is a history that justifies itís creation and existence as a way of addressing a specific environmental threat. This discussion will review the test requirements and focus on the threat that is intended to protect against as well as how itís accompanying test method is to be performed.