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Meeting Notice

The IEEE Southeastern Michigan EMC Society presents

"A Tutorial on ISO EMC Standards Development'

Presented by: Kin Moy

Date: 10/9/2001

Time: 5:30 PM

Eaton Corporation - Innovation Center - B Conference Rooms - 2nd Floor 26201 Northwestern Highway Southfield, Michigan 48076. Maps to Eaton may be found at

Use the Civic Center West Entrance. Look for the white IEEE sign at the door. Take the elevator to the 2nd floor B Conference rooms.

This is a FREE event. Snacks and refreshments will be provided at 5:30 PM. Presentation at 6:00 PM

Please RSVP: with the number of people attending in the subject line or call 248-354-5245

To be added or removed from the e-mailing list, email to with ADD or REMOVE in subject line.


Speaker: Mr. Kin Moy  

Presentation information:

Title: ISO (International Organization for Standardizations) global EMC test standards development effort (immunity to EM disturbances) for vehicle and components.

Abstract: The history of the EMC test standards development within ISO (TC22/SC3/WG3) is discussed. The development effort is focused on immunity of vehicle and components to conducted and radiated Electromagnetic (EM) disturbances. The current and future work items are presented. Current test standards are summarized and presented.

Bio: Kin P, Moy currently is the department head for EMC Technology and Data Communication Systems at Packard Electric Systems, Delphi Automotive Systems located in Warren, Ohio. He has been involved with EMC standards activities for over 20 years. Presently, he is chairman of the SAE United States Technical Advisory Group (USTAG) and chief delegate to ISO TC22/SC3/WG3 as well as vice chairman of the SAE EMI committee. He also serves on the SAE EMR committee, 42V Advisory Committee, USTAG for SC3, and WG 13 & 14. He received his Bachelor and Masters degree in Electrical Engineering from Youngstown State University.

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