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 Meetings
Upcoming Events:
June 23, 2011
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| Date: |
June 23, 2011 |
| Time: |
6:00-7:30pm - Seminar |
| Location: |
Rio Grande Conference room at SVTC
(view map)
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| Topic: |
Noise as an Assessment Technique for Degradation in LDMOS Transistors
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| Description: |
Degradation mechanisms observed in LDMOS transistors differ substantially from the
degradation effects usually observed in standard CMOS transistors. In addition, as
the current is flowing at the interface, and as the gate or the drain is subjected to
high voltage, LDMOS devices are prone to hot carrier injection, trap generation and
degradation, leading to higher Ron, and lower Idsat . Several LDMOS characteristics such
as breakdown voltage, specific on-resistance, on-state breakdown voltage or safe operating
area, and energy capability interact with each other in a competing manner, requiring compromises.
This presentation will focus on determination of different degradation mechanisms in LDMOS using
noise power spectral density measurements. The techniques developed by our group separates the
contribution to degradation from different regions, specifically the channel/gate dielectric interface,
extended lateral drain/gate dielectric interface, and the drain drift region.
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| Speaker: |
Zeynep Çelik-Butler
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| Speaker Bio: |
Zeynep Çelik-Butler is Professor of Electrical Engineering and Director of Nanotechnology
Research and Teaching Facility at the University of Texas at Arlington. She received dual B.S.
degrees in electrical engineering and physics from Bogaziçi University, Istanbul, Turkey, in 1982.
She received the M.S. and Ph.D. degrees in electrical engineering in 1984 and 1987, respectively,
from the University of Rochester. She was an IBM Pre-doctoral Fellow from 1983 to 1984, and an Eastman
Kodak Pre-doctoral Fellow from 1985 to 1987. She joined the Department of Electrical Engineering at
Southern Methodist University in 1987 as an Assistant Professor; was tenured and promoted to Associate
Professor in 1993. Dr. Çelik-Butler was the holder of J. Lindsay Embrey Trustee Assistant Professorship
from 1990 to 1993. She served as the Assistant Dean of Graduate Studies and Research from 1996 to 1999.
She moved to University of Texas at Arlington in 2002.
She served in various technical committees including 1988, 1989 IEEE-IEDM's and Annual Symposia on
Electronic Materials, Processing and Characterization (1989 - 1992) and International Conference on
Noise in Physical Systems and 1/f Fluctuations (1993, 1999, 2001-2009 ). She was the General Chair
of TEXMEMS II Workshop. She was the co-Chair for the SPIE Conf. on Noise in Devices and Circuits in
the Symp. on Fluctuation and Noise (FaN'2003) and the symposium co-chair for the same symposium in
2005 (FaN’2005). She was an editor for Fluctuation and Noise Letters from 1999 to 2005. She currently
serves in the editorial board of IEEE Transactions on Electron Devices and Journal of Nanoelectronics
and Optoelectronics.
Prof. Çelik-Butler has received several awards including the University of Texas at Arlington Outstanding
Research Achievement Award (2006), IEEE-Dallas Section Electron Devices Society Outstanding Service Awards
(1995, 1997), IEEE-Electron Devices Society, Service Recognition Award (1995, 2009), IEEE-Electron Devices
Society, Distinguished Lecturer Appreciation Award (2006), Outstanding Electrical Engineering Graduate Faculty
Awards (1996, 1997, 2001), and SMU-Sigma Xi Research Award (1997). Her research interests include
microelectromechanical systems, multi-functional reconfigurable sensors, noise and reliability in
nanoelectronic devices. She has four awarded and three pending patents, six book chapters, and over
170 journal and conference publications in these fields. Dr. Çelik -Butler’s research has been supported
by NSF, NASA, AFOSR, ARO, Texas Higher Education Coordinating Board, SRC, Texas Instruments, Freescale
Semiconductor, Laerdal Co., L-3 Communications, Legerity, ST-Microelectronics, Raytheon and Lockheed
Martin Aeronautics.
Dr. Çelik-Butler is a senior member of IEEE, member of Eta Kappa Nu, and the American Physical Society.
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