RMCEMC September 2006 Meeting #2
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Improvements in IC design for Electromagnetic Compatibility and Signal Integrity by Etienne Sicard Date: September 21st, 2006 Time: 6:30 pm - pizza social, 6:55 pm - business meeting, 7:00 pm - presentation (1.5 hrs) Location: College Hilltop Library, 3645 W. 112th Ave., Westminster, CO, Room L107 (first floor)
Abstract The challenging Electromagnetic Compatibility (EMC) issues in the design of electronic systems have moved recently into integrated circuit (IC) design, pushed by a strong demand from the automotive and aeronautic industries. This talk will illustrate the evolution of technology of integrated circuits, the mechanisms for generation of parasitic noise, and a status on standardized and novel measurement methods. Signal integrity issues will be addressed from the point of view of internal supply bounce, cross talk and input/output structures for high-speed data transfer. Efficient design techniques to improve EMC compatibility will be reviewed and illustrated. This talk will also facilitate a discussion on the tools and methods for modeling EMC of ICs. BIO Etienne
Sicard received the B.S degree in 1984 and the PhD in Electrical Engineering
from the University of Toulouse, France, in 1987. He stayed 18 months at
Osaka University, Japan, and one year as an invited professor at the
University of Balearic Islands, Spain. Etienne Sicard is currently a
professor at INSA of Toulouse, Department of Electrical and Computer
Engineering. He was a visiting professor at the electronic department of
Carleton University, Ottawa, Canada in 2004. His research interests include
several aspects of CAD tools for the design and electromagnetic
compatibility of integrated circuits. He is the author of books, software
and more than 100 technical papers in these areas. Etienne is a member of
the SEE and IEEE societies. |
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