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IEEE Workshop on Microelectronics and Electron Devices (WMED)

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Invited Tutorial - Memory: The Center of the Universe

Dr. Richard Murphy, Micron Technology, Inc


The memory system is typically the primary driver behind system performance, which has been acknowledged as the von Neumann bottleneck since the invention of the modern electronic computer in the 1940s. Tremendous unsustainable investments have been made on the processor side to attempt to get around the problem. However, the end of Dennard Scaling in 2003 meant that the memory wall must finally be addressed to support the transition to simpler, multicore architectures. Consequently, computer architects must consider the fundamental system-level tradeoffs, rather than myopically focusing on CPU core architecture. This talk will describe the first decade of the transition into the new era of computer architecture, its impact on application performance, and what we as a community can do about it.

Speakerís biography:

Dr. Richard Murphy is a Senior Advanced Memory Systems Architect for Micronís DRAM Systems Group. He joined Micron in 2012 and is focused on future memory platforms, including Processing-In-Memory. Prior to Micron, Dr. Murphy was a Principal Member of the Technical Staff at Sandia National Laboratories. He has also worked as a technical staff member at Sun Microsystems. His specialties include research and development of computer architecture, advanced memory systems, and supercomputing systems for physics and data-intensive problems, and he has been served as the Principal Investigator of several advanced computing R&D efforts, including projects for the Defense Advanced Research Projects Agency (DARPA) and the Department of Energy (DOE). He co-founded the Graph 500 benchmark and currently chairs its executive committee. Dr. Murphy is Adjunct Faculty at the Electrical and Computer Engineering Departments at the Georgia Institute of Technology and New Mexico State University, and holds a Ph.D. in computer science and engineering, as well as an M.S., B.S., and B.A. from the University of Notre Dame.





This workshop is receiving technical co-sponsorship support from the IEEE Electron Devices Society.

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