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IEEE Workshop on Microelectronics and Electron Devices (WMED)

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WMED 2013 Workshop Awards

Please find below the workshop awards for WMED 2013

Best Paper Award : Process and Device

"Numerical Simulation of Silicon Wafer Warpage Due to Thin Film Residual Stresses", A. H. Abdelnaby, G. P. Potirniche, F. Barlow, and A. Elshabini, S. Groothuis and R. Parker, University of Idaho/Micron.

Best Paper Award : Circuits and Sytems

"Systematic Design of 10-bit 50MS/s Pipelined ADC", K. Zhu, S. Balagopal, and V. Saxena, Boise State University.

Best Paper Award: Micron Research Symposium

"Deep Sub-Wavelength Optical Nanolithography: Going Beyond the Far-Field Diffraction Limit", Rajesh Menon, University of Utah.

Best Poster Award

"Process risk based adaptive sampling solution for semiconductor manufacturing processes", Vijay Butte, Micron Technology, Boise.





This workshop is receiving technical co-sponsorship support from the IEEE Electron Devices Society.

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