IEEE Workshop on Microelectronics and Electron Devices (WMED)
2017 IEEE Workshop on Microelectronics and Electron Devices
Welcome to the Fifteenth Annual IEEE Workshop on Microelectronics and Electron Devices (WMED 2017). WMED 2017 is a technical forum for reviewing and discussing all aspects of micro- and nano-electronics including processing, electrical characterization and reliability, design, and new device technologies. This workshop will consist of invited talks, contributed papers, and a poster session throughout the day. Faculty, students, and researchers in industry are encouraged to contribute presentations on either completed research or work-in-progress.
WMED offers a unique opportunity in the
Microelectronic Device Processing and Process Integration
Trends in Submicron CMOS technology, Product development (DRAM, SRAM, Flash, CMOS Imagers), new device technologies (Phase Change Memory, Resistive Memory, Ferroelectric Memory), Novel transistors
Nanoelectronic Devices and MEMS
Novel processes, materials and device characterization on nanotubes, nanowires, quantum dots, molecular devices, MEMS research
Microelectronic Device Electrical and Reliability Testing
Dielectric reliability, Device reliability, Novel memory technology testing schemes
Semiconductor Packaging and Reliability
Semiconductor package reliability, Design for Manufacturability, Stacked die packaging and Novel assembly processes
Microelectronic Circuit Design
New product design, high-speed and/or low-power design techniques and architectures and memory sensing schemes
University Travel Award
Attendees and Participants are eligible for a Travel Subsidy (up to $500.00)
Contact WMED Publications Chair, Durga Panda (firstname.lastname@example.org, +1 208-363-4283) for details.
If you require a US VISA and letter of acknowledgment from WMED in order to attend the workshop and present your paper, we strongly urge that you submit your manuscript early (Recommended manuscript submission by 12/30/2016) and request "expedited review".
2016 WMED Highlights:
This workshop is receiving technical co-sponsorship support from the IEEE Electron Devices Society.