Upcoming IEEE SCV EDS Evening Meeting:
Tuesday, October 14, 2008 IEEE SCV EDS Meeting:
"Soft Errors - No Way To Escape"
Speaker: Dr. Helmut Puchner, Cypress Semiconductor
Subject: "Soft Errors - No Way To Escape"
Location: National Semiconductor, Building E1, Conference Center,
2900 Semiconductor Drive, Santa Clara, CA 95051.
See the NSC Campus driving directions
and the NSC Building E location map
Time: 6:00 PM - Pizza , 6:15 PM - Lecture
Speaker Contact:
Manuj Rathor
Abstract:
Soft Errors gained a lot of attention since the mid 90's when contaminated
packaging material caused massive device failures. Since then a lot of improvements
have mitigated most of the alpha particle related soft errors. Due to the continuous
technology scaling, however, comic rays induced soft errors have gained significantly
and are nowadays the major threat to modern semiconductor devices. Most vulnerable
are SRAM devices since they operate at high speed and relatively low storage node
charges. We will present the fundamentals of soft errors, their sources in common
semiconductors as well as the different available mitigation techniques.
Every attendee will receive a free copy of "Soft Errors - History, Trends and
Challenges" published by J.Ziegler and H.Puchner.
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Upcoming IEEE SCV EDS Evening Meeting:
Biography:
HELMUT PUCHNER received his Ph.D. degree from the Technical University
of Vienna, Austria, in Electrical Engineering in 1996. His Ph.D. thesis
adviser was Siegfried Selberherr the world-famous scholar and MINIMOS
inventer. He joined LSI Logic in Santa Clara in 1997 as TCAD device
development engineer. In 2002 he joined Cypress Semiconductor, where he
is currently Device Director responsible for transistor development, TCAD,
device reliability and ESD. His research interests include soft error
mitigation and power transistors including their reliability aspects.
He has published more than 80 conference/journal articles and hold 18 US
patents.
He is a Sr IEEE Member and is currently serving on the program committees
of IEDM (MT - memory technology)and IRPS (soft errors).
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