ieeelogoblue.gif Electron Devices Society
Santa Clara Valley Chapter
http://www.ewh.ieee.org/r6/scv/eds/
The field of interest of the IEEE EDS is all aspects of the physics, theory, and phenomena of electron and ion devices, such as elemental and compound semiconductor devices, quantum effect devices, optical devices, tubes and other vacuum devices.

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October 1, 2008
For an online version of this announcement with active links, please visit
http://www.ewh.ieee.org/r6/scv/eds/announcements/ieee-scv-eds-20081001.html
October 14th Meeting
Dr. Helmut Puchner, Cypress Semiconductor
"Soft Errors - No Way To Escape"


 


 


 
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Upcoming IEEE SCV EDS Evening Meeting:

Tuesday, October 14, 2008 IEEE SCV EDS Meeting:

"Soft Errors - No Way To Escape"

Speaker: Dr. Helmut Puchner, Cypress Semiconductor
Subject: "Soft Errors - No Way To Escape"
Location: National Semiconductor, Building E1, Conference Center,
      2900 Semiconductor Drive, Santa Clara, CA 95051.  
      See the NSC Campus driving directions
      and the NSC Building E location map
Time: 6:00 PM - Pizza , 6:15 PM - Lecture
Speaker Contact: Manuj Rathor

Abstract:

Soft Errors gained a lot of attention since the mid 90's when contaminated packaging material caused massive device failures. Since then a lot of improvements have mitigated most of the alpha particle related soft errors. Due to the continuous technology scaling, however, comic rays induced soft errors have gained significantly and are nowadays the major threat to modern semiconductor devices. Most vulnerable are SRAM devices since they operate at high speed and relatively low storage node charges. We will present the fundamentals of soft errors, their sources in common semiconductors as well as the different available mitigation techniques.

Every attendee will receive a free copy of "Soft Errors - History, Trends and Challenges" published by J.Ziegler and H.Puchner.



Upcoming IEEE SCV EDS Evening Meeting:

Biography:

HELMUT PUCHNER received his Ph.D. degree from the Technical University of Vienna, Austria, in Electrical Engineering in 1996. His Ph.D. thesis adviser was Siegfried Selberherr the world-famous scholar and MINIMOS inventer. He joined LSI Logic in Santa Clara in 1997 as TCAD device development engineer. In 2002 he joined Cypress Semiconductor, where he is currently Device Director responsible for transistor development, TCAD, device reliability and ESD. His research interests include soft error mitigation and power transistors including their reliability aspects. He has published more than 80 conference/journal articles and hold 18 US patents.

He is a Sr IEEE Member and is currently serving on the program committees of IEDM (MT - memory technology)and IRPS (soft errors).

 



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