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|Sept 27, 2017
|Understanding Connector Failures and Implications
Abstract: Any interconnect used to transmit or provide power is susceptible to failure, which may occur with dramatic results. This talk will explore a host of common root causes for power connector failures, and will explain the analysis techniques used to identify them. As possibly the most predominant power delivery interconnect for portable electronics in use today, specific consideration will be given to a survey of micro-USB failure modes. The talk will conclude with discussion of some potential mitigation techniques and a conversation regarding who may be responsible for these types of failures (adapter, cable, or device manufacturers).
| Dr. Mike S. Mehlman, Ph.D.,
Senior Scientist, Electrical Engineering & Computer Science,
Last Modified: 06/26/2017