IEEE Reliability

IEEE - SCV - Reliability

Archives

Date	Type	Subject	Speaker	Place
May 28, 2008	Seminar	Electronic Prognostics (EP). (Abstract)(Slides)	Dr. Kenny Gross	HP-Cupertino
April 30, 2008	Seminar	Reliability Performance & Measurement of Repairable Systems. (Abstract)(Slides)	Dr. Wendai Wang	HP-Cupertino
April 24, 2008	Seated Lunch	CPMT joint session with SCV Rel. "Sustainable Information Technology Ecosystem: Optimizing Datacenter Power and Cooling." (Abstract)	Chandrakant Patel	Sunnyvale, CA
April 9, 2008	Seated Dinner	CPMT joint session with SCV Rel. "A New Perspective on Electronic Product Reliability: Prognostics and Health Management." (Abstract)	Prof Michael Pecht	Sunnyvale, CA - see link for details
Mar 26, 2008	Seminar	Leading Indicators: A More Effective Method of Accelerated Life Testing (Abstract)(Slides)	Arthur Zingher	HP-Cupertino
February 27, 2008	Seminar	Best of RAMS (Abstract)	Panel, RAMS attendees	HP-Cupertino
January 23, 2008	Seminar	Best of ISTFA (Abstract)	Panel	HP-Cupertino
October 24, 2007	Seminar	Formation of a Warranty Chain Management Institute and its Applicability for Reliability Engineers (Abstract)(Slides)	Glen Griffiths, Allison Griffiths	HP-Cupertino
September 26, 2007	Seminar	Early Reliability Testing (Abstract)	Mike Silverman and Arthur Zingher	HP-Cupertino
May 30, 2007	Seminar	Designed Experiments and Reliability (Abstract)	Ed Russell	HP-Cupertino
April 25, 2007	Seminar	Mean Time to Data Loss: A Poor Choice for Assessing RAID Reliability (Abstract)	Jon Elerath	HP-Cupertino
March 28, 2007	Seminar	Design Traits of Effective Reliability Programs (Abstract) (Slides)	Fred Schenkelberg	HP-Cupertino
March 7, 2007	Seminar	Best of RAMS (Abstract)	Mike, Fred & Panel	HP-Cupertino
Jan. 31, 2007	Seminar	Best of ISTFA (Abstract)	Art & Panel	HP-Cupertino
October 25, 2006	Seminar	Trapped by MTBF? (Abstract)	Fred Schenkelberg	HP-Cupertino
Sept 27, 2006	Seminar	Lot Acceptance Test: A Viable Solution for Parts Incoming Inspection (Abstract)	Sorin Witzman	HP-Cupertino
May 31, 2006	Seminar	FA benefits, logistics, and limitations(Abstract)	Sorin Witzman and Fred Schenkelberg	HP-Cupertino
April 26, 2006	Seminar	Competitive Teardown Analysis(Abstract)	Doug Farel	HP-Cupertino
March 29, 2006	Seminar	Design for Warranty (DfW) Cost Reduction(Abstract)	Doug Farel	HP-Cupertino
March 1, 2006	Seminar	Best of RAMS(Abstract)	Mike & Fred	HP-Cupertino
Jan. 18, 2006	Seminar	Best of ISTFA(Abstract)	Art & Panel	HP-Cupertino
Oct. 26, 2005	Seminar	ESD Qualification Testing Needs to Grow Up (Abstract)	Jon Barth	HP-Cupertino
Sept. 28, 2005	Seminar	Built-In Soft Error Resilience for Robust System Design (Abstract)(Slides)	Subhasish Mitra	HP-Cupertino
Sept. 14, 2005	Seminar	Kirkendall Voids in Lead-Free Solder Joints: A Reliability Issue (Abstract)	Zequn Mei
May 25, 2005	Seminar	Best of ARS (Applied Reliability Symposium) (Abstract)(Slides1)(Slides2)	David Trindade, Mike Silverman, Fred Schenkelberg	HP-Cupertino
April 27, 2005	Seminar	When to use HALT and when to use ALT (Abstract)(Slides)	Mike Silverman	HP-Cupertino
March 23, 2005	Seminar	How cosmic rays cause computer downtime(Abstract)(Slides)	Ray Heald	HP-Cupertino
Feb. 23, 2005	Seminar	Best of RAMS(Abstract)	Panel	HP-Cupertino
Jan. 26, 2005	Seminar	Best of ISTFA(Abstract)	Panel	HP-Cupertino
Oct. 27, 2004	Seminar	Reliability Horror Stories(Abstract)	Jurek Zarzycki	HP-Cupertino
Sept. 29, 2004	Seminar	Are You Analyzing Reliability Data Correctly? Repairable Vs. Non-Repairable Systems: There Is a Difference(Abstract)(Slides)	David Trindade	HP-Cupertino
June 23, 2004	Seminar	Design and Analysis of Accelerated Reliability Tests(Abstract)(Slides)	Larry George	HP-Cupertino
May 26, 2004	Seminar	Cisco's High Level Failure Analysis Process(Abstract)	Dennis Pachuki	HP-Cupertino
April 28, 2004	Seminar	A Reliability Engineer's Use of Warranty Cost Information (Abstract)(Slides)	Fred Schenkelberg	HP-Cupertino
March 31, 2004	Seminar	Moving from ORT to HASA (Abstract)	Mike Silverman	HP-Cupertino
Feb 25, 2004	Seminar	Best of RAMS (Abstract)	Panel	HP-Cupertino
Jan 28, 2004	Seminar	Best of ISTFA (Abstract)	Panel	HP-Cupertino
Oct 29, 2003	Seminar	Power Supply Reliability – an Oxymoron? (Abstract) (Slides)	Dave Christiansen and Brooks Leman	HP-Cupertino
Sept 24, 2003	Seminar	To CRE or not to CRE? (Abstract)	Mike Silverman	HP-Cupertino
Aug 27, 2003	Seminar	How to make a CFO care about Reliability (Abstract) (Slides)	Alan Wood	HP-Cupertino
Jun 25, 2003	Seminar	SoC Defect Testing ( Abstract)	Samiha Mourad, Yacoub Elziq	HP-Cupertino
May 28, 2003	Seminar	Reliability of IC Packaging ( Abstract) ( Slides)	Joseph Fjelstad	HP-Cupertino
Apr 30, 2003	Seminar	Reliability Evolution through Product Lifecycle Phases ( Abstract) ( Slides)	Lalit A Patel	HP-Cupertino
Mar 26, 2003	Seminar	Server Class Disk Drives: How Reliable are They? ( Abstract) ( Slides)	Jon Elerath	HP-Cupertino
Feb 26, 2003	Discussion	Best of RAMS ( Abstract)	Panel	HP-Cupertino
Jan 29, 2003	Discussion	Best of ISTFA ( Abstract)	Panel	HP-Cupertino
Jan 28-29, 2003	2-day Course	Reliability Concepts and Practices ( Abstract)	Mike Silverman	HP-Cupertino
Oct 30, 2002	Seminar	Accelerated Testing as Part of a Traditional Reliability Program ( Abstract)	Mike Silverman	HP-Cupertino
Sep 25, 2002	Seminar	Accelerated Life Testing in Micro- and Opto-Electronics: Its Objectives, Role, Attributes, Challenges, Pitfalls, Predictive Models, and Interaction with Qualification Tests ( Abstract)	E Suhir	HP-Cupertino
Aug 28, 2002	Seminar	Real-World Software Reliability Overview ( Abstract)	Alan Padula	HP-Cupertino
Jul 31, 2002	Seminar	Monitoring IC Degradation Internally ( Abstract)	Ted Lundquist	HP-Cupertino

*Date*	April 30, 2008
Topic	Electronic Prognostics (EP)
*Abstract*	In today's world of eCommerce, down time for enterprise servers in business-critical datacenters costs millions of dollars per hour. The System Dynamics, Characterization and Control group at Sun Microsystems has pioneered new proactive fault monitoring innovations for enhancing the reliability, availability, and serviceability of computer servers. The key enabler for Electronic Prognostics is a patented continuous system telemetry harness (CSTH), implemented in software, which collects time series signals relating to the health of dynamically executing servers and their components, network interconnects, and peripherals. These time series provide quantitative metrics associated with physical variables (distributed temperatures, voltages, and currents throughout the system), performance variables (loads, throughputs, queue lengths, etc.), and various quality-of-service (QOS) metrics. The CSTH signals are continuously archived to an offline circular file (i.e. the "Black Box Flight Recorder"), and are also processed in real time using advanced pattern recognition for proactive anomaly detection. The pattern recognition provides sensitive early detection of a variety of mechanisms that are known to cause downtime in enterprise datacenters, including: Environmental issues (thermal anomalies, air-flow restrictions, degraded fan motors); Software aging phenomena (memory leaks, resource contention); Degraded/failed sensors; Degradation of power supplies, capacitors, and interconnects; and "inferential sensing" capability (wherein a failed sensor is replaced with a highly accurate analytical estimate). Sun Microsystems' CSTH coupled with advanced pattern recognition techniques adapted from the commercial nuclear and aerospace industries are helping to increase component reliability margins, system availability goals, and optimal energy utilization for enterprise computing datacenters.
*Speaker*	Kenny Gross received his Ph.D. in nuclear engineering from the U. of Cincinnati in 1977. Kenny is a Distinguished Engineer for Sun Microsystems and is team leader for the System Dynamics Characterization and Control team in Sun's Physical Sciences Research Center in San Diego. Kenny specializes in advanced pattern recognition, continuous system telemetry, and dynamical system characterization for improving the reliability, availability, and serviceability of enterprise computing systems. Kenny has 194 US patents issued and pending, 168 scientific publications, and was awarded a 1998 R&D 100 Award for one of the top 100 technological innovations of that year, for an advanced statistical pattern recognition technique (MSET) that was originally developed for nuclear and aerospace applications and is now being used for a variety of applications to improve quality, availability, and energy efficiency for enterprise computer servers.
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*Date*	April 30, 2008
Topic	Reliability Performance and Measures of Repairable Systems
*Abstract*	Many multi-component systems such as automobile, computer servers, production & industrial equipment, appliance, engines, and power systems are generally repairable in service. It is also known that reliability performance metrics and analysis methodologies for non-repairable systems versus repairable systems are quite different. You would be surprised that the reliability theory for repairable systems is so underutilized. Most reliability engineering practices for repairable systems were directly adopted from methodologies for non-repairable systems, which are “well” developed. Many assumptions are commonly used, consciously or unconsciously, in engineering practices such as exponential distribution for the “time between failures” (TBF) and even for the “time to restore” (TTR). Traditional reliability theory (which primarily applies to non-repairable systems) is built upon the fundamental (random) variable of the time to failure (TTF). The TTF distribution defines all reliability metrics mathematically and practically. Similarly should the behavior of both time between failures (TBF) and time to restore (TTR) together describe the reliability performance of a repairable system? Because of the complexities associated with modeling of repairable system reliability, most research studies have only focused on evaluating the limiting statistical values such as steady-state system Availability, steady-state system MTBF, and etc. These limited evaluations, in turn, are typically based on one of the stationary Stochastic Point Processes such as Homogeneous Poisson Process, Non-Homogeneous Poisson Process, Renewal Process, Markov Process, and Regeneration Process - basically a certain level of “renewal” at the system level. In reality, maintenance activities, such as repairing, refurbishing and replacing, are really taking place at the module level. Reliability performance of a multi-component repairable system is actual an assembly of realizations for of all components. This seminar will be started with some case studies on the behavior of both TBF and TTR of simple repairable systems and of multi-component repairable systems, from which some simple conclusions are drawn and should be applied directly in engineering practices. Reliability performance and measures for repairable systems are then presented and discussed. If you are interested in helping select papers, being on the panel, leading a discussion, or contributing in another way, please e-mail us at reliability@ieee.org.
*Speaker*	Dr. Wendai Wang is a senior member of technical staff of Applied Materials, where he is leading design-for-reliability for new product development. Prior to this position, he was the Reliability Technical Leader at General Electric, where he had successfully led many innovative “design-for-reliability” projects and the GE Reliability Council as well. He received his B.S. and M.S. in electro-mechanical engineering from Shanghai Jiaotong University and his Ph.D. in reliability engineering from the University of Arizona. He has about 20-year industry and research experience in Reliability Engineering. He is the author of over 30 publications and invention disclosures and His work and research area includes DFR methodology and process, reliability modeling and analysis, reliability testing, mechanical and electronics reliability, physics of failure, and reliability training. Wendai is also an active member of the RAMS Management Committee and is currently the Reliability Engineer Society (SRE) Silicon Valley Chapter Vice President.
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*Date*	Mar 26, 2008
Topic	Leading Indicators: A More Effective Method of Accelerated Life Testing
*Abstract*	Real-world problems motivate engineering leadership: Teams must overcome real-world challenges and constraints in life test and operational maintenance. Therefore Ops A La Carte has invented a practical new technology, using a "Leading Indicator", and a patent is pending. Leading indicators can improve common challenges and constraints: -There are too few specimens and too little time available for life testing. -For a life test to be meaningful, the acceleration must be mild. -Life testing results are too late to improve product development. -Maintenance ought to be based on the real-time status of each specific unit. -By contrast, engineering methods typically describe the average status of a population of similar units in similar operation. Leading indicators can provide advanced warning, can improve Accelerated Life Tests, Manufacturing Screening, and Operational Maintenance. If you are interested in helping select papers, being on the panel, leading a discussion, or contributing in another way, please e-mail us at reliability@ieee.org.
*Speaker*	· Arthur Zingher is a Senior Reliability Consultant with Ops A La Carte. Previously, he was a Distinguished Engineer at Sun Microsystems, focused on computer hardware. Earlier, he was a Research Staff Member at IBM, Yorktown NY. His education included a Ph.D. in Physics from U.C. Berkeley and a B.A. in Physics & Math from Columbia. Arthur is a versatile physicist, engineer and inventor, with expertise and accomplishments in: Test & reliability, instrumentation, math; Electronic packaging, cooling, electronics, mechanics; Manufacturability and rapid technology troubleshooting for very acute commercial problems. This included successes in products and factories, plus more than 33 issued patents. Also, Arthur is active in Highly Concentrated Solar Photovoltaic Power generation.
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*Date*	February 27, 2008
Topic	Best of RAMS
*Abstract*	The 54th Annual Reliability and Maintainability Symposium (RAMS) was held in Las Vegas on January 28-31, 2008. For those of you that couldn't attend, we will bring the symposium to you (except for the slot machines). This evening offers highlights of the best papers presented at RAMS during this 4 day event. The theme of this year’s RAMS was “Dawn to Dusk – Life Cycle Prescriptions”. Information on RAMS is available on the web at http://www.rams.org/. The panel is being organized by Mike Silverman and Fred Schenkelberg. If you are interested in helping select papers, being on the panel, leading a discussion, or contributing in another way, please e-mail us at reliability@ieee.org.
*Speaker*	Panel, RAMS attendees
*Vita*	Mike Silverman from Ops Ala Carte will lead the panel discussion. Mike Silverman is an experienced leader in reliability improvement through analysis and testing. He has also led numerous quality system development programs. He has 22 years of reliability and quality experience, the majority in start-up companies. Mike is also an expert in accelerated reliability techniques, including HALT and HASS. He set up and ran an accelerated reliability test lab for 5 years, testing over 300 products for 100 companies in 40 different industries. Mike is founder and managing partner at Ops A La Carte, a Professional Business Operations Company that offers a broad array of expert services in support of new product development and production initiatives. Through Ops A La Carte, Mike has had extensive experience as a consultant to high-tech companies, and has consulted for over 100 companies including Cisco, Ciena, Siemens, Intuitive Surgical, Abbott Labs, and Applied Materials. He has consulted in a variety of different industries including telecommunications, networking, medical, semiconductor, semiconductor equipment, consumer electronics, and defense electronics. Mike has authored and published 7 papers on reliability techniques and has presented these around the world including China, Germany, and Canada. He has also developed and currently teaches 8 courses on reliability techniques. Mike has a BS degree in Electrical and Computer Engineering from the University of Colorado at Boulder, and is both a Certified Reliability Engineer and a course instructor through the American Society for Quality (ASQ), IEEE, Effective Training Associates, and Hobbs Engineering. Mike is a member of ASQ, IEEE, SME, ASME, PATCA, and IEEE Consulting Society.
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*Date*	January 23, 2008
Topic	Best of ISTFA
*Abstract*	The International Symposium for Testing and Failure Analysis (ISTFA) provides a forum for the latest developments in wafer, chip, package, and board level test and failure analysis. The 30th ISTFA was held November 4-8, 2007, in San Jose. Information on ISTFA is available on the web at http://www.asminternational.org/istfa/. The January Santa Clara Valley IEEE Reliability Society meeting will feature a panel discussion of selected papers from ISTFA. The panel is being organized by Art Rawers. We are looking for additional panel members, especially ISTFA attendees. If you are interested in helping select papers, being on the panel, leading a discussion, or contributing in another way, please e-mail us at reliability@ieee.org.
*Speaker*	Panel
*Vita*	Mike Silverman from Ops Ala Carte will lead the panel discussion. Mike Silverman is an experienced leader in reliability improvement through analysis and testing. He has also led numerous quality system development programs. He has 22 years of reliability and quality experience, the majority in start-up companies. Mike is also an expert in accelerated reliability techniques, including HALT and HASS. He set up and ran an accelerated reliability test lab for 5 years, testing over 300 products for 100 companies in 40 different industries. Mike is founder and managing partner at Ops A La Carte, a Professional Business Operations Company that offers a broad array of expert services in support of new product development and production initiatives. Through Ops A La Carte, Mike has had extensive experience as a consultant to high-tech companies, and has consulted for over 100 companies including Cisco, Ciena, Siemens, Intuitive Surgical, Abbott Labs, and Applied Materials. He has consulted in a variety of different industries including telecommunications, networking, medical, semiconductor, semiconductor equipment, consumer electronics, and defense electronics. Mike has authored and published 7 papers on reliability techniques and has presented these around the world including China, Germany, and Canada. He has also developed and currently teaches 8 courses on reliability techniques. Mike has a BS degree in Electrical and Computer Engineering from the University of Colorado at Boulder, and is both a Certified Reliability Engineer and a course instructor through the American Society for Quality (ASQ), IEEE, Effective Training Associates, and Hobbs Engineering. Mike is a member of ASQ, IEEE, SME, ASME, PATCA, and IEEE Consulting Society.
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*Date*	October 24, 2007
Topic	Formation of a Warranty Chain Management Institute and its Applicability for Reliability Engineers
*Abstract*	Warranty costs in the US alone run in the region of $28B per annum [ref - Warranty Week, 3rd March 2007 edition]. Reliability Engineers have a significant influence on the failure rates of equipment, which is a key driver of warranty events and hence cost. Glen will outline the path he has taken, beginning with an investigation into how to improve reliability engineering practices in Hewlett Packard, that led to the creation of a new Warranty Conference series and culminated in the formation of the Institute of Warranty Chain Management (iWCM), of which he is currently President. Along the way, he will discuss the iWCM’s applicability and usefulness to reliability Engineers and introduce the Director of the Warranty Chain Management Conference series, Alison Griffiths.
*Speaker*	Glen Griffiths and Allison Griffiths, HP
*Vita*	Glen Griffiths is the director of Hewlett Packard’s Global Engineering Services responsible for providing engineering and regulatory support across all HP hardware businesses. He manages over 180 people spread across 24 countries with his teams supporting over $60B of products sales annually. Glen’s professional experience has centered on electrical, avionic and reliability engineering as well as systems engineering. Glen retired from the UK Royal Air Force, after serving 22 years as an Engineering Officer. In his previous roles he was operations manager for a squadron of Jaguar strike attack aircraft, managed the software development and test teams for the Harrier aircraft (AV8B) fleet and managed a multi-national team of software reliability and engineering R&D advisors for the Typhoon aircraft. During his last 3 years in the military he was responsible for setting Reliability & Maintainability requirements for all United Kingdom Military Air systems procurement and he also acted as the UK reliability specialist advisor to the US Department of Defense Joint Strike Fighter Project. Glen holds a Masters in Business Administration, a Masters in Reliability and Maintainability Engineering and an Honors degree in General Engineering. He is a Chartered Engineer in the IEEE and also holds the position of President of the Institute of Warranty Chain Alison Griffiths is the President of the business management consultancy ALG Associates, LLC, which she originally founded in the UK in 2002, transferring to the US in 2004. Alison has 15 years of business, management and consultancy experience; having worked in the public and private sector, manufacturing, retail and customer service industries. She has led a number of key process improvement initiatives and has key experience in assessing organizational needs, developing strategies and improvement plans, problem and conflict resolution, as well as staff training and development. In 2004 Alison launched the Warranty Chain Management (WCM) series of conferences to address the important need for a forum where professionals can meet to discuss warranty issues and begin to develop warranty management as a recognized business discipline. Following a call to action for the development of a recognized warranty institute at the WCM 2006, Alison was instrumental in forming and serving on a Charter Team to create the Institute of Warranty Chain Management (iWCM). She incorporated the iWCM in California in December 2006 and now serves as the Executive Director to the Board of Directors. Alison studied at Manchester Metropolitan University, UK and has a BA(Hons) in Business Studies and an MBA.
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