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IEEE SCV Reliability Chapter Events

 

Date

Day

Type

Subject

Speaker

Cost

Time

Place

Feb 2, 2011

Thurs

Tour

Best of RAMS 2012 RAMS Attendees Free 6:30 to 7:00 Sign in, Snacks and social

7:00 to 8:00 Chapter updates and Presenters.

Oak Room, Hewlett Packard

Take the Wolfe Rd exit off 280 and go north.  Right at the corner of Pruneridge and then left into the HP parking area.  Follow signs to Oak Room. 

May 9, 2012

Thurs

Tour

Linking Product / Process Reliability to Business Process Excellence Mike Silverman, Shree Nanguneri Free 6:00 to 6:30 Sign in, Snacks and social

6:30 to 7:30 Chapter updates and Presenters.

7:30 to 8:00 Q&A

Applied Materials, Bowers Cafe

Other Upcoming Reliability Events

Date

Subject

Place

May 24-26, 2011

SME Conference (RAPID)

Minneapolis, MN

June 6-8, 2011

Medical Device and Manufacturing, East

New York, NY

June 7-9, 2011

2011 International Applied Reliability Symposium (ARS)

San Diego, CA

June 20-23, 2011

2011 IEEE International Conference on Prognostics and Health Management

Denver, CO

Aug 2-4, 2011

National Instruments Week Conference 2011

Austin, TX

September 2011

SMTA/MED Phoenix

Phoenix, AZ

Sept 25-29, 2011

PHM Conf

Montreal, Canada

Sept 28-30, 2011

Accelerated Stress Testing & Reliability

San Francisco, CA

Nov 1-3, 2011

Medical Device and Manufacturing, Minneapolis

Minneapolis, MN

Dec 6-7, 2011

Biomed

San Jose, CA

 

 

www.reliabilitycalendar.org

 

Follow this link to the page of all current Bay Area IEEE events

 

 

Follow this link for the next ASQ Silicon Valley Statistics Reliability Discussion event

 

ASQ Silicon Valley Statistics & Reliability Discussion Group

Held at Bowers Cafe of Applied Materials, 3090 Bowers Ave, Santa Clara, CA

Date

Day

Type

Subject

Speaker

Cost

Time

Place

               
               
               
               

 

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Details on upcoming IEEE Rel ChapterTalks

Date

Feb 2 , 2012

Topic

Best of RAMS 2012

Abstract

Every year, the Reliability and Maintainability Symposium (RAMS) brings together top professionals in reliability.   Military, academia and industry professionals from around the world are there to share ideas.

RAMS attendees will highlight the talks they thought were exceptional (hopefully exceptionally good but exceptionally bad is fair game).  

This is not intended to be a full presentation of those talks -- it is intended only as a primer to the people who could not attend. 

 

 Speakers

This will be a group presentation by the attendees of RAMS.

 

 

Top

 

Date

May 9 , 2012

Topic

Linking Product / Process Reliability to Business Process Excellence

Abstract

Design for Lean Six Sigma (DFLSS) and Design for Reliability (DFR) are modern methods for both problem prevention and problem solving.

 

Design for Lean Six Sigma (DFLSS) uses an approach to product and/or process development that results in higher yields, lower implementation costs and smoother introduction of cutting edge technology. The DFLSS methodology is not an academic approach to process and product engineering. It does involve science. It also takes into account the integration of the actual process and the science behind the technology.

 

As the design helps fabricate, the product (or process is tested against the model to verify the validity of the model). Whenever a difference between the two is detected the model is adjusted and the simulation rerun. This iterative process allows us to bring the facility on line and at an operational level much quicker than conventional engineering firms.

 

The real advantage to the DFSS process is that it allows us to bring in projects with cost, which can be significantly less than that of your competition.  The most important issue is in the process’ ability to come on line faster after completion than is typical via using conventional design methodology. As technology and process requirements are concurrently engineered, it is not a process of design, build and commercialize to see if it works. When we bring a product on line it is with a process of optimization rather than resuscitation. This allows you to qualify and launch production quickly. This will ultimately allow the facility to begin paying for itself (generating revenue) in a shorter time period. The ultimate goal of all projects such as this is to generate a return on investment. Our value proposition to our customer base has always been maximizing the Return on Investment.

 

Design For Reliability (DFR) is the process of designing reliability into designs. This process encompasses several tools and practices and describes the order of their deployment that an organization needs to have in place to drive reliability and improve maintainability in products, towards an objective of improved availability, lower sustainment costs, and maximum product utilization or lifetime.

 

Typically, the first step in the DFR process is to establish the system’s reliability goals. Reliability must be "designed in" to the system. During system design, the top-level reliability requirements are then allocated to subsystems by design engineers, maintainers, and reliability engineers working together.

 

In this presentation, the synergy between the DFR and DFLSS methods will be presented and discussed.

 Speakers

Shree Nanguneri, CEO, MGBS Inc.

 

Shree has over 20 years of experience as a Lean Six Sigma consultant that inclusive of his tenure at GE Plastics. Shree has a deep understanding of the voice of the customer toward process improvement and customer feedback. He is a senior master black belt and has trained several hundreds of professionals in process breakthrough, utilizing, lean six sigma methods, including QFD. Shree works in the East Bay area of Livermore, CA. He just published his first book on Lean Six Sigma titled “Lean Six Sigma Tweet” in June 2011.

 

Mike Silverman, Managing Partner, Ops A La Carte LLC

 

Mike is founder and managing partner at Ops A La Carte, a Professional Consulting Company that has an intense focus on helping customers with end-to-end reliability. Mike has over 25 years of experience in reliability engineering, reliability management and reliability training. He is an experienced leader in Design for Reliability techniques.  Through Ops A La Carte, Mike has had extensive experience as a consultant to high-tech companies, and has consulted for over 500 companies in over 100 different industries in most of the United States and 15 countries around the world. Mike is an expert in accelerated reliability techniques and owns HALT and HASS Labs, one of the oldest and most experienced reliability labs in the world. Mike has recently completed his first book on reliability entitled “How Reliable Is Your Product: 50 Ways to Improve Product Reliability”. Mike is currently the IEEE Reliability Society Santa Clara Valley Chapter Chair.

 

Top

 

 

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Past Events (Annual Reliability Professional Meetings)

Date

Subject

Place

May 16-18, 2011

ASQ World Conference on Quality

Pittsburgh, PA

May 16-20, 2011

Photonics North

Ottawa, Canada

May 2011

SMTA Conf on Soldering and Reliability

Toronto, Canada

Apr 10-14, 2011

International Reliability Physics Symposium

Monterey, CA

Mar  15-17, 2011

Warranty Chain Management Conference

San Diego, CA

Feb 5, 2011

Modeling and Simulation of Dynamical Systems

http://css-seminar2011a.eventbrite.com.

Sunnyvale, CA

Jan 24-27, 2011

RAMS 2011

Orlando, FLA

Dec 8, 2010

IPC, Solving Problems with Reliability, Repair, and Rework in the Lead-Free Era

Santa Clara, CA

Oct 20-22, 2010

ISETC 2010

Santa Clara, CA

Nov 16, 2010

Silicon Valley Engineering Council

Biltmore Hotel
2151 Laurelwood Rd
Santa Clara, CA 95054

Oct 20-22, 2010

IARS -- Asia Pacific

Singapore

Oct 20-22, 2010

ISETC 2010

Santa Clara

October 11-15, 2001 Design for Excellence (DFR Solutions) Austin, Texas

Oct 6-8, 2010

ASTR 2010

Denver, CO

Oct 1, 2010

Silicon Valley Engineering Council

UCSC Extension, Santa Clara, CA

Sept 14 - 16, 2010

RIAC Open Training

Seattle, WA

June 15 - 18, 2010

IARS (International Applied Reliability Symposium)

Reno, NV

June 8 - 11, 2010

CALCE 2010 Symposium Email

Deer Valley, Phoenix, Az

May 2 - 6, 2010

2010 IRPS (International Reliability Physics Symposium)

Anaheim, CA

Apr 19 - 23, 2010

DFX by Ops Ala Carte

Reno, NV

Mar 31 - Apr 2, 2010

IPC APEX

Santa Clara, CA

Mar 23 - 24, 2010

SELSE 2010

Stanford, CA

March 22-24, 2010

ISQED (International Symposium on Quality Electronic Design)

San Jose, CA

Feb 21 - 25, 2010

SEMI-THERM 26

Las Vegas, NV

Jan 26-28, 2010

SMTA Pan Pacific on Microelectronics

Kauai, Hawaii

Jan 25 - 28, 2010

RAMS 2010

San Jose, CA

Nov 1 - 6, 2009

ITC (International Test Conference)

Reno, NV

October 23rd, 2009 ASQ Quality Conference The Techmart, Santa Clara, CA

Oct 18-22, 2009

IRW (International Reliability Workshop --  AKA Wafer Level Reliability Workshop)

Fallen Leaf Lake, CA

Oct 7-9, 2009

ASTR 2009

Jersey City, NJ

Oct 4-8, 2009 SMTA International San Diego, CA

Sept 27- Oct 1, 2009

PHM09 (International Conference on Prognostics and Health Management)

San Diego, CA

September 16-17, 2009 SMTA Phoenix, AZ
August 1-6, 2009 JSM (Joint Statistical Meeting) Washington, DC

July 21-25, 2009

ICRMS 2009

Chengdu, China

June 29-July 2, 2009

DSN (Dependable Systems and Networks)

Portugal

June 24 -26, 2008 IOLTS (International On-Line Testing Symposium) Portugal
June 17, 2009 SMTA San Jose, CA

June 9 - 12, 2009

ARS (Applied Reliability Symposium) 2009

San Diego, CA

June 3-5, 2009 QPRC (Quality and Productivity Research Conference) New York, NY
June 1-2, 2009 Military and Aerospace Forum San Diego, CA

May 8, 2009

Green Reliability Seminar

Cupertino, CA

April 26-30, 2009

2009 IRPS (International Reliability Physics Symposium)

Montreal, Quebec, Canada

March 24-25, 2009

2009 IEEE SELSE (Silicon Errors in Logic – System Effects)

Stanford Univ, Palo Alto, CA

March 16-18, 2009

ISQED (International Symposium on Quality Electronic Design)

San Jose, CA

March 5, 2009

IPC/JEDEC Conference on Pb-Free Electronics, San Jose

San Jose, CA

March 2, 2009

The Multi-Dimensional Design Space of Power, Reliability, Temperature and Voltage in Highly Scaled Geometries  

Cadence San Jose Campus, CA

February 10-12, 2009

SMTA Pan Pacific on Microelectronics

The Big Island of Hawaii

Jan 26-29, 2009

RAMS, Reliability and Maintainability Symposium

Fort Worth, TX

Nov 10-12, 2008

IPC International Test and Inspection Technology Conference

Santa Clara, CA

Oct 28-30, 2008

Internation Test Conference (ITC 2008)

Santa Clara, CA

Oct 22-24, 2008

ARS (Applied Reliability Symposium Singapore)

Singapore

Oct 12-16, 2008

IRW (International Reliability Workshop --  AKA Wafer Level Reliability Workshop)

Fallen Leaf Lake, CA

Oct 6-9, 2008

PHM08 (International Conference on Prognostics and Health Management)

Denver, CO

Oct 1-3, 2008

ASTR (Accelerated Stress Testing and Reliability  )

Portland, OR

Sept 9-10, 2008

CALCE Symposium on Avoiding, Detecting, and Preventing Counterfeit Electronic Parts

 

Aug 3-7, 2008

JSM (Joint Statistical Meetings) 2008

Denver, CO

July 7-9, 2008

IOLTS (International On-Line Testing Symposium)

Greece

June 24-27, 2008

DSN (Dependable Systems and Networks) 2008

Anchorage, AK (Alaska)

June 17-20, 2008

ARS (Applied Reliability Symposium, Reno, NV)

Reno, NV

June 4-6, 2008

QRPC (Quality & Productivity Research Conference) 2008

Madison, WI

 

Last Modified: 12/06/2011