Description: IEEE


IEEE Santa Clara Valley Reliability Chapter

Current Chapter Events

IEEE SCV Reliability Chapter November 7th, 2017 One-Day Soft Error Rate Workshop, Xilinx, San Jose, CA

IEEE Santa Clara Valley Reliability Chapter November Workshop
Co-sponsored with EPS and EDS chapters  



From IBM, Intel, Swift, Xilinx, Cypress, Mitsubishi, Stanford


Our annual IEEE Soft Error Rate Workshop will enter its 9th year! With our focus on alpha-induced soft errors and unique offering of simultaneous on-site and remote participation, we have provided opportunities for presentation and interactive discussion on a variety of critical subjects on SER for an ever-increasing international audience. You are now invited to register for this year’s event. We will continue a format piloted last year: We have invited two industry experts in the field to offer tutorials on fundamentals of soft errors, and on experimental approaches.


Date and Time