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Description: IEEE

 

IEEE Santa Clara Valley Reliability Chapter

Current Chapter Events

IEEE SCV Reliability Chapter November 7th, 2017 One-Day Soft Error Rate Workshop, Xilinx, San Jose, CA


IEEE Santa Clara Valley Reliability Chapter November Workshop
Co-sponsored with EPS and EDS chapters  

 

Speakers

From IBM, Intel, Swift, Xilinx, Cypress, Mitsubishi, Stanford
 

Abstract:

Our annual IEEE Soft Error Rate Workshop will enter its 9th year! With our focus on alpha-induced soft errors and unique offering of simultaneous on-site and remote participation, we have provided opportunities for presentation and interactive discussion on a variety of critical subjects on SER for an ever-increasing international audience. You are now invited to register for this year’s event. We will continue a format piloted last year: We have invited two industry experts in the field to offer tutorials on fundamentals of soft errors, and on experimental approaches.

 

Date and Time

Location

Registration