IPFA 2012
Marina Bay Sands Singapore
2 - 6 July 2012

The 19th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) is organized by the IEEE Reliability/CPMT/ED Singapore Chapter. The Symposium is technically co-sponsored by the IEEE Electron Device Society and IEEE Reliability Society. Also, IPFA will be celebrating its 25th year in 2012.

IPFA 2012 will be devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield, especially those related to advanced process technologies.

Call for papers - please click for pdf file

Abstract Submission - please go to this page to submit your abstract

Keynote Speaker: Professor Chenming Hu
                             TSMC Distinguished Chair Professor in Graduate School,
                             University of California, Berkeley

Title: 3D FinFET and Other Sub-22nm Transistors

For further enquiries, please contact:

IPFA Secretariat: Mrs Jasmine Leong

Address: Blk 121 Paya Lebar Way #03-2801 Singapore 381121

Tel: (65) 6743 2523

Email: ipfa@pacific.net.sg