Medidor Automático Para La Determinación De Conductividad De Sólidos Semiconductores (Automatic Meter for Determination of Solid Semiconductors Conductivity)

Héctor Gellon (hgellon@unsl.edu.ar), Martín Murdocca (mmurdocc@unsl.edu.ar), Carlos Federico Sosa Páez (cfsp@unsl.edu.ar), Ricardo Petrino (rpetrino@unsl.edu.ar)


Universidad Nacional San Luis
This paper appears in: Revista IEEE América Latina

Publication Date: Sept. 2010
Volume: 8,   Issue: 5 
ISSN: 1548-0992


Abstract:
Conditions and requirements for the measurement of oxide semiconductors conductivity as well as methods and equipments available, are presented in this paper. Reasons are given for the automatic meter designed in this work. Conductivity is determined based on the voltage-current method using a PC and a commercial data acquisition board. The instrument is described mentioning the relevant points considered in the design. The software for the operation of the system is described as well as measurements results obtained in the laboratory on components that emulate the real experiments.

Index Terms:
Measurement, Conductivity measurement, Semiconductor materials measurements Semiconductor materials.   


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