Nuevo Circuito Electronico para la Detección de Fallas en el IGBT (Study of a Novel Electronics Circuit for Detecting Faults in the IGBT)

Marco Antonio Rodríguez Blanco (marblanco73@hotmail.com)1, Amsi Vázquez Perez (amsivp@yahoo.com.mx)1, Leobardo Hernández González (bilbito_98@yahoo.com)2, Victor Golikov (vgolikov@pampano.unacar.mx)1, Jesús Aguayo Alquicira (jaguayo@cenidet.edu.mx)3, Manuel May Alarcón (mmay@pampano.unacar.mx)1


1Universidad Autónoma del Carmen
2Instituto Politécnico Nacional, Escuela
3Centro Nacional de Investigación y Desarrollo Tecnológico CENIDET

This paper appears in: Revista IEEE América Latina

Publication Date: May 2014
Volume: 12,   Issue: 3 
ISSN: 1548-0992


Abstract:
In this paper the analysis of an electronic circuit for detecting faults in the IGBT based on measuring the gate signal is presented. The proposed circuit uses discrete analog and digital devices for future implementation on the side of the IGBT gate driver without introducing optocouplers or DACs. The purpose of this work is to design a simple and robust electronic circuit to detect failures early. Only the failures by short-circuit and open-circuit device are considered in this work. To achieve an early detection the IGBT gate signal behavior during turn-on transient is used and to achieve the robustness an adaptive threshold is added. Finally all stages of the general scheme for detection and identification of faults are simplified to obtain a compact electronic circuit and the results are validated with PSpice software using real components exclusively.

Index Terms:
Insulated Gate Bipolar Transistor, Motor drive, Adaptive Threshold, Fault Detection and Isolation, Residual.   


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