Circuito Detector de Fallas a través de las Señales de Compuerta del IGBT (Fault Detection Circuit Based on IGBT Gate Signal)

Eligio Flores (eligio_flores@cenidet.edu.mx)1, Abraham Claudio (peabraha@cenidet.edu.mx)1, Jesus Aguayo (jaguayo@cenidet.edu.mx)1, Leobardo Hernández (bilbito_98@yahoo.com)2


1Centro Nacional de Investigación y Desarrollo Tecnológico
2ESIME-IPN

This paper appears in: Revista IEEE América Latina

Publication Date: Feb. 2016
Volume: 14,   Issue: 2 
ISSN: 1548-0992


Abstract:
The detection circuit presented in this paper has the purpose of detecting short circuit and open circuit faults in insulated gate devices (IGBT). The detection circuit design is based on the analysis of the IGBT gate signal VGE, which is characterized by carrying out the fault detection within the IGBT switching times under test. The fast fault detection is due to the following considerations: a) Employing technology components with a high slew rate, allows the detection within the switching times, b) Employing fewer components allow the circuit design less expensive and faster, and This paper presents the experimental validation results for the proposed fault detection cases.

Index Terms:
Early Fault detection, Short circuit and Open circuit Faults, IGBT devices, fault detection signals   


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