Past Novosibirsk Chapter Events

The Second IEEE-Russia Conference MIA-ME'99 is organized by Novosibirsk State Technical University (NSTU), Novosibirsk, Russia; Joint ED15/MTT17/COM19/CPMT21 Chapter of IEEE, Novosibirsk, Russia; and supported by the IEEE MTT-S, ED-S, CPMT-S, COM-S; A.S. Popov Society for Radioengineering, Electronics and Communications, Russia; Siberia State Research Institute of Metrology, Novosibirsk, Russia.

Chairman: A.Vostrikov, Rector of NSTU, Russia
Vice-Chairmen:
V.Snournitsin, NSTU, Russia, Tel/fax +7-3832-462598 e-mail: crra@ref.nstu.ru B.Kapilevich, SibSUTI, Russia, Tel.: +7-3832-660943, Fax: +7-3832-222581, e-mail: boris@neic.nsk.su

V. Denisov, NSTU, Russia; Ye. Tsoi, NSTU, Russia; Van der Vort, IEEE, ED-S,USA; J. Modelski, IEEE, MTT-S, Poland; Yu. Kozljaev, SibSUTI, Russia; G. Landsberg, A.S.Popov Sc. and IEEE Russia Section; R.Wyndrum Jr. IEEE, CPMT-S, USA; J. Kevers - IEEE COM-S Region 8, Belgium; B. Ivlev, Novosib. Reg. Adm., Russia; L. Lisitsina, NSTU, Russia; G. Katunina, A.S.Popov Sc., Russia

V. Gridchin, NSTU, Russia; V. Shuvalov, SibSUTI, Russia; V.Petrov, NSTU, Russia; V. Romodin, NIIEP, Russia; Andre V. Vorst, IEEE, Region-8, Belgium; Dr. W.Matveichuck, Research Inst. of Metrology, Russia; P.Guillon, IRCOM, France; M. Guglielmi, ESA, ESTEC, The Netherlands; A. Omar, University of Magdeburg, Germany; C.Akyel, Polytech. University, Canada; Ikuo Awai, Yamaguchi University, Japan; C. Rauscher, Res. Lab., USA

Session 1. Characterization of high power microwave systems and devices: Procedures of identification of non-linear devices; Techniques for measurements and testing, Modeling, and Performance Evaluation.
Session 2. Microwave passive and active filters, resonators, component and devices: Analysis/Synthesis, Optimization, CAD and Software Engineering.
Session 3. Microwave electron devices and components: Solid-state devices, Integrated devices, ÍTS-materials and device, Silicon mechanical sensors.
Session 4. Microwave/RF Mobile, Cellar, Television, Wireless, and Communication Systems.
Session 5. Microwave/RF: Industrial, Scientific and Medical/Biological Applications.

Tutorials/Workshops, Exhibitions and Excursions
The Organizing Committee would like to receive proposals for 4-hour Tutorials and Workshops. Exhibitors are encouraged to present the latest innovations in Microwave/RF technique. Potential exhibitors should submit their requirements to the Vice-Chairman by May 1th, 1999. Excursions will be organized for participants of the conference to novosibirsk Technopark and Siberia Research Institute of Metrology.

Papers must be received by 30 May 1999. The papers will be refereed and authors will be notified of acceptance by 30 June 1999. Papers presented by students and based on their own work will be considered for the Best Student Paper Award. Limited financial supporting for registration is available to students presenting papers.

Dr. V.Snournitsin, NSTU, 20 K. Marx Ave., 630092 Novosibirsk, Russia, Tel/fax +7-3832-462598, e-mail: crra@ref.nstu.ru, More information will be available at http://www.ieee.org/society/eds, http://www.nstu.ru/miame99

May 30, 1999: Submission papers to Conference Committee (3 hard copies and diskettes)
June 30, 1999: Acceptance notification
August 10, 1999: Advanced Program

1999 Chapter Meeting Schedule

April 21-23, 1999, Novosibirsk ,Russia, All Russian National Conference on Informatics and Telecommunications Problems, Session no.13 dedicated to Electron Device Physics and Component Technologies.

May, 1999, Novosibirsk, Russia (the date will be corrected), Novosibirsk Student Scientific Conference (the Chapter will support session dedicated to Electronic Component Manufacturing).

May 18-20, 1999, Tomsk, Russia, 3-th International Symposium "Conversion of Science for International Cooperation", SibCONVERS'99, Session: Electronic Components.

June 18, 1999, Novosibirsk, Russia, Semi-annual Chapter Meeting.

September 23-25, 1999, Novosibirsk ,Russia, 2-nd 1999 IEEE International Conference on High Power Microwave Electronics (MIA-ME'99), Session 4: Physical and Electrical Properties of Integrated Circuits and Devices Including Their Manufacturing.

November 25, 1999, Novosibirsk, Russia, Annual Chapter Meeting.