| |
Introduction
and Opening Remarks (Robert Malucci) |
8:20
AM |
| 1 |
Session
I - Connectors I (Milenko Braunovic / Stephen
Cole) |
8:40
- 10:00 |
| 1:1 |
Contact
Stress Relaxation and Resistance Change
Relationships in Accelerated Heat Age Testing,
K.L. Beach, V.C. Pascucci, Tyco Electronics,
Harrisburg, PA. |
Abstract 1:1 |
| 1:2 |
The
Electrical and Mechanical Performance of Corroded
Products on gold Plating after Long Term Indoor
Air Exposure, Y.L. Zhou, X.Y. Lin, J.G. Zhang,
Beijing University of Posts &
Telecommunications, China. |
Abstract 1:2 |
| 1:3 |
Sliding
Wear Experiments on Clad Gold-Nickel Material
Systems Lubricated with a 6-Ring Polyphenyl
Ether, N.R. Aukland, H. Hardee, New Mexico State
University, Las Cruces, NM; P. Lees, Technical
Materials, Inc., Lincoln, RI. |
Abstract 1:3 |
| 1:4 |
Reliability
Assessment of Compression Contact for Socketable
Components, A.R. Nagel, C.Gonzalez, C. Frutschy,
Intel Corporation, Chandler, AZ. |
Abstract 1:4 |
| 2 |
Session
2 - Connectors II (Pat Lees / Richard Moore) |
10:30:
11:30 |
| 2:1 |
Optimization
of Shape Memory Alloys for Use in Electrical
Connectors, T.J. Yurick, Jr., S.E. Mohney, G.L.
Gray, Penn State Univeristy, University Park, PA. |
Abstract 2:1 |
| 2:2 |
Combination
Effect of Fretting and Corrosion on Bolt-Type
Power Connectors, G.P. Luo, L.J. Xu, J.G. Zhang,
Beijing University of Posts &
Telecommunications, China |
Abstract 2:2 |
| 2:3 |
Overheating
of Flexible Tinned Copper Connectors, M.
Braunovic, MB Interface, Montreal, Canada |
Abstract 2:3 |
| 3 |
Session
3 - Low Current Arcing (Gerald Witter / Philip
Wingert) |
1:00
- 2:40 |
| 3:1 |
Erosion
and Contact Resistance Performance of Materials
for Sliding Contacts Under Arcing, N.B. Jemaa, L.
Morin, University of Rennes, France; D. Jeannot,
F. Hauner, Metalor Electrotechnics, France |
Abstract 3:1 |
| 3:2 |
Test
and Analysis of Reliability for Electromagnetic
Relays, K. Li, F. Yao, J. Lu, Z. Li, Bebei
University of Technology, P.R. China |
Abstract 3:2 |
| 3:3 |
Optimized
Contact Erosion by Using Electronegative Gases in
Telecom Relays, W. Johler, AXICOM Ltd.,
Switzerland. |
Abstract 3:3 |
| 3:4 |
Mechanisms
of the Low Contact Resistance Properties for
Ag-Pd-Mg Contacts, T. Tamai, Hyogo University,
Japan. |
Abstract 3:4 |
| 3:5 |
A
Study of Contact Reliability in N-Hexane with
Small Load Currents, T. Soma, M. Hasegawa, K.
Sawa, Keio University, Japan. |
Abstract 3:5 |
| 4 |
Session
4 - Modeling and Testing (Paul Slade / Chi Leung) |
3:10
- 4:10 |
| 4:1 |
Study
and Reliability Analysis on Testing Instrument
for Dynamic Contact Resistance on Contact, W. Li,
G. Liu, Z. Li, Hebei University of Technology,
China. |
Abstract 4:1 |
| 4:2 |
Modeling
of Vacuum Reed Failure by Using Finite Element
Method, L.J.Xu, J.G.Zhang, Beijing University of
Posts & Telecommunications, China; B.
Miedzinski, Wroclaw University of Technology,
Poland. |
Abstract 4:2 |
| 4:3 |
Development
of An Application Specific Integrated Circuit for
Reduction of Contact Bounce in Three Phase
Contactors, J.H. Kiely, H. Nouri, F. Kalvelage,
T. Davies, University of the West England,
Bristol, United Kingdom. |
Abstract 4:3 |
| |
Social
at Bubba Gump Shrimp Co. Restaurant & Market |
6:00
pm |
Tuesday, September 26, 2000
| 5 |
Session
5 - High Current Arcing (Werner Reider / Engelber
Hetzmannseder) |
8:30
- 9:50 |
| 5:1 |
Arc
Root Commutation from Moving Contacts in Low
Voltage Devices, J.W. McBride, K. Pechrach,
University of Southhampton, United Kingdow, PM.
Weaver, PBT Ltd., United Kingdom. |
Abstract 5:1 |
| 5:2 |
The
Unusual Electrical Erosion of High Tungsten
Content, Tungsten Copper Contacts Switching Load
Current in Vacuum, P.G.Slade, W.Li, L.D. Loud,
R.E. Haskins Jr., Cutler-Hammer Inc., Horseheads,
NY. |
Abstract 5:2 |
| 5:3 |
Erosion
Dependency of 3-Phase Contactor Contacts on
Configuration of Loads, H. Noun, F. Kalvelage,
T.S.Davies, J.H. Kiely, University of the West of
England, Bristol, United Kingdom. |
Abstract 5:3 |
| 5:4 |
The
Influence of Arc Chamber Wall Material on Arc Gap
Dielectric Recovery Voltage, J.J. Shea,
Cutler-Hammer Inc., Pittsburgh, PA. |
Abstract 5:4 |
| 6 |
Session
6 - Fundamentals (John Shea / John McBride) |
10:20-11:40 |
| 6:1 |
Contact
Current Distortion Due to Tunnel Effect, E.
Takano, Sendai, Japan |
Abstract 6:1 |
| 6:2 |
Spectroscopic
Measurement of Ag Break Arc, K. Yoshida, A.
Takahashi, Nippon Institute of Technology, Japan. |
Abstract 6:2 |
| 6:3 |
Resistance
Change at Copper Contacts with Thin and Thick
Oxide Films Under a Zero Force Liquid Gallium
Probe, D.R. Liu, S. McCarthy, Ford Motor Company,
Dearborn, MI |
Abstract 6:3 |
| 6:4 |
Correlation
Between Arcing Phenomena and Electromagnetic
Noise of Opening Electric Contacts, Y. Ebara, H.
Sone, Y. Nemoto, Tohoku University, Japan. |
Abstract 6:4 |
| |
Awards
Luncheon
1999 IEEE Holm Conference Erle Shobert Prize
Paper Award
L. Morin, N. Ben Jamaa, D. Jeannot, J.
Picard, L. Nadelec "Make Arc Erosion and
Welding in the Automotive Area"
2000 Armington Recognition Award
Dr. Werner Reider |
11:40-1:30 |
| 7 |
Session
7 - 42 Volt Tutorial Session (Ed Smith III /
Robert Malucci) |
1:30-3:00 |
| 7:1 |
The
Impact of 42 Volt Automotive Electrical Systems
on Electrical Contacts, Robert Beer, Delphi
Packard Electric Systems |
|
| 7:2 |
Seminar
on Switching 42V DC Automotive Electrical
Circuits, Paul G. Slade, Cutler-Hammer,
Horseheads Operations |
|
| 8 |
Automotive
(George Drew / Sean McCarthy) |
3:30-4:30 |
| 8:1 |
Lab-Field
Correlation Program for Automotive Electrical
Connections, F.W. O'Malia, C.M. Cope, G.P.
Martin, Delphi Automotive Systems, Warren, Ohio. |
Abstract 8:1 |
| 8:2 |
An
Influence of Commutation Arc in Gasoline on Brush
Wear and Commutator, M. Takaoka, K. Sawa, Keio
University, Japan. |
Abstract 8:2 |
| 8:3 |
Reliability
Improvement for an Automotive Fuel Level Sensor,
H.W. Ireland, R.L. Farrar, Delphi Automotive,
Flint, MI; E.F. Smith III, The J.M. Ney Company,
Bloomfield, CT; R. Cooper, CTS
Resistor/Electrocomponents, Berne, IN. |
Abstract 8:3 |
| |
TC-1
Meeting (Gerald Witter) |
4:30-5:30 |
Wednesday, September 27, 2000
| 9 |
Session
9 - Silver Metal Oxide (Henry Czajkowsi / Michael
Myers) |
8:30-9:30 |
| 9:1 |
Advanced
AgSnO2 Contact materials for the Replacement of
AgCdO in High Current Contacts, F. Hauner, D.
Jeannot, J. Pinard, Metalor Contat, K. McNeilly,
Chemet Corp., Attleboro, MA. |
Abstract 9:1 |
| 9:2 |
Study
on the Behavior of Silver Rare Earth Oxide
Contact Material, J. Wang, B. Wang, M. Wen, Y.
Lu, Y. Luo, Z. Li, Hebei University of
Technology, P.R. China. |
Abstract 9:2 |
| 9:3 |
Influence
of the Contact Material on the Performance of
Temperature-Dependent Switching Controllers in
Household Appliance, V. Behrens, T. Honig, A.
Kraus, AMI DODUCO GmbH, Germany |
Abstract 9:3 |
| 10 |
Session
10 - Fretting (William Abbott / Ed Smith III) |
10:10-11:40 |
| 10:1 |
Influence
on the Length and Severity of Intermittences in
Electrical Contacts, C. Maui, J.W. McBride, J.
Swingler, Unversity of Southhampton, united
Kingdom |
Abstract 10:1 |
| 10:2 |
Fretting
in Copper-to-Copper Contacts under AC and DC
Current Conditions, D. Gagnon, IREQ, Varennes,
Canada, M. Braunovic, MB Interface, Montreal,
Canada. |
Abstract 10:2 |
| 10:3 |
Possible
Mechanism for Observed Dynamic Resistance, R.D.
Malucci, Molex, Inc., Lisle, IL. |
Abstract 10:3 |
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