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Introduction
and Opening Remarks
Paul Slade,
2003 Holm Conference Chair
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8:00
AM
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Holm
Scientific Achievement Award
Fretting Corrosion Degradation, Threshold Behavior and Contact
Instability,
Robert D. Malucci, RD Malucci Consulting, IL
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8:10-9:10
Abstract
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Coffee
Break
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9:10-9:30
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1
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Session
1 - Connectors (Roland Timsit / John Shea)
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9:30-11:10
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1.1
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Experimental
and Theoretical Investigations on Connector Insertion Phase
A. El Manfalouti, N. Ben jemaa, R. El Abdi, University
of Rennes1, France; T. Reiss, Hirschmann Austria GmbH, Austria
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Abstract 1:1
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1.2
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3-D-Signal Integrity Simulation
and Measurements on an Electrical Hermaphrodite Connector Interface
Achim Brenner, Horst F. Nowacki, HARTING KGaA, Germany
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Abstract 1:2
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1.3
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Investigate
the Influence of Contact Impedance on Digital Signal Transmission by
Computer Simulation Method
Chen Ya, Baisheng Sun, Beijing University of Posts &
Telecommunications, China
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Abstract 1:3
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1.4
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Friction
Behavior of Press-Fit Applications: Test Apparatus and Methodology
Ned Corman, Marjorie Myers, Charles Copper, Tyco
Electronics Technology, PA
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Abstract 1:4
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Modeling
Early Stage Fretting of Electrical Connectors Subjected to Random Vibration
George T. Flowers, Fei Xie, Michael Bozack, Roland
Horvath, Auburn University, AL; Robert D. Malucci, Bretton I. Rickett,
Molex Inc., IL
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Abstract 1.5
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Coffee
Break
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11:10-11:30
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Session
2 - Sliding Contact (Steve Cole / Dick Moore)
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11:30-12:30
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2:1
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Frictional Work as a Sliding Wear Evaluation
Parameter
Neil Aukland, Charles Harrington, Delphi, MI; George Drew, C. David
Wright, Grant Wheeler, Delphi, OH
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Abstract 2:1
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2:2
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Influence of Surface Roughness on Voltage Drop of
Sliding Contacts under Various Gases Environment
Takahiro Ueno, Noboru Morita, Nippon Institute of
Technology, Japan; Koichiro Sawa, Keio University, Japan
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Abstract 2:2
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2:3
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Influence
of Small Slide Vibration over Au-Au Electric Contact Phenomenon
Yu Yonezawa, Noboru Wakatsuki, Ishinomaki Senshu
University, Japan.
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Abstract 2:3
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Lunch
(on your own)
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12:30-2:00
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3
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Session
3 - Breakers &Contactors (John Shea / Henry Czajkowski)
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2:00
- 3:20
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3:1
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Visual
Measurements of Plasma Arc Modes in a High-Current Vacuum Arc with an Axial
Magnetic Field
Erik D. Taylor,
Eaton Cutler-Hammer, NY
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Abstract 3:1
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3:2
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Arc
Root Mobility on Piezo-Actuated Contacts in Miniature Circuit Breakers
K. Pechrach,
J.W. McBride, University of Southampton, United Kingdom; P.M. Weaver,
Servocell PBT Ltd., United Kingdom
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Abstract 3:2
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3:3
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Investigations
on Mass Change and Surface Morphology of Contacts in Electromagnetic
Contactor
Masaaki
TAKASHIMA, Nahoko YAMAMURA, Koichiro SAWA, Keio University, Japan; Makoto
HASEGAWA, Chitose Institute of Science and Technology, Japan; Yoshitada
WATANABE, Kogakuin University, Japan
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Abstract 3:3
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3:4
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A
Novel Concept for Fault Current Tolerable Contactors
Xin Zhou,
Michael Little, Eaton Corporation, WI
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Abstract 3:4
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Coffee
Break
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3:20-3:40
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4
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Session
4 - High Current Connectors (Werner Reider / Xin Zhou)
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3:40
- 4:40
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4:1
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Degradation of Power Contacts in Industrial
Atmosphere: Plating Alternative for Silver and Tin
Bella H. Chudnovsky, Square D Company, OH
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Abstract 4:1
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4:2
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The Mathematical Models of Welding Dynamics in
Closed and Switching Electrical Contacts
S.N. Kharin, H. Nouri, T. Davies, University of the West
of England, United Kingdom
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Abstract 4:2
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4:3
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Effect of Intermetallic Phases on the Performance
of Tin-Plated Copper Connections and Conductors
M. Braunovic, MB Interface, Canada
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Abstract 4:3
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Social
- Dinner at Tony & Joe’s Seafood Place
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6:00
pm
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Tuesday, September 9,
2003
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5
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Session 5 - Materials (Jerry Witter / Thomas
Schoepf)
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9:00 - 10:00
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5:1
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Microstructure Effect on Reignition and Welding Properties
of Copper-Tungsten Electric Contact
Chi Leung, Eric
Streicher, Dennis Fitzgerald, Dan Ilich, AMI DODUCO, PA
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Abstract 5:1
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5:2
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The Composition Change of Contact Material
Surface
Wu Xixiu, Di Meihua, Li Zhenbiao, Huazhong University of
Science and Technology, China; Liu Chengyan, G&A Technologies, Inc.,
China
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Abstract 5:2
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5:3
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Welding Characteristics of Ag-based Contact
Material Under Automobile Lamp Load
Liu Xiangjun,
Fei Hongjun, Fuzhou University, China; Feng Xiao, Fujian Province
Engineering Institute, China
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Abstract 5:3
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Coffee Break
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10:00-10:20
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6
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Session 6 - Automotive Arcing (John McBride / Z. K.
Chen)
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10:20-11:20
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6:1
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Mitigation of Connector Damage During Disengaging
DC Loads Using Polymeric Arc Suppressor
Thomas J.
Schoepf, Rafil A. Basheer, Abdellah Boudina, Delphi Research Labs, MI;
George A. Drew, Delphi Packard Electrical Systems, MI
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Abstract 6:1
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6:2
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Make Arc Erosion and Welding Tendency under 42 VDC
in Automotive Area
L. Doublet, N. Ben
Jemaa, University of Rennes1, France; F. Hauner, D. Jeannot, Metalor
Technologies SAS, France
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Abstract 6:2
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6:3
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Mitigation and Analysis of Arc Faults in Automotive DC
Networks
Thomas J. Schoepf,
Malakondaiah Naidu, Suresh Gopalakrishnan, Delphi Research Labs, MI
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Abstract 6:3
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Morton Antler Lecture
42 Volt Challenges: Technical Potholes on the Highway to Success,
Norman L. Traub, SAE International, MI
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11:30-12:30
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Awards Luncheon
2003 Ragnar Holm Scientifc Achievement Award - Dr. Robert Malucci
2003 Morton Antler Lecture -
Norman L. Traub
2002 IEEE Holm Conference Erle Shobert Prize Paper Award
D. John J. Shea “Gassing
Arc Chamber Wall Material Effect on Post Current-Zero Recovery Voltage
Breakdown”
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12:30-2:00
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Workshop on the Transition to a Lead–free Industry
Chair:
Pat Lees
Panel Members:
Wayne Johnson, Auburn University
Pete Elmgren, Molex
Robert Hilty, Tyco Electronics
Neil Brown, Shipley
Jonathan Best, Delphi Packard Electric Systems
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2:00-4:00
Overview & Abstracts
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TC-1 Meeting (Gerald Witter)
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4:15-5:30
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Wednesday, September 10,
2003
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7
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Session 7 - Relays (Pat Lees / Chi Leung)
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8:00-10:00
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7:1
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RF Performance of Ultra-miniature High Frequency
Relays
Werner Johler, Tyco
Electronics AXICOM, Austria
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Abstract 7:1
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7:2
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An Experimental Study on Operating Characteristics of
Ag, Pd and Cu Contacts in Argon Atmosphere
Makoto
Hasegawa, Kenta Imai, Chitose Institute of Science & Technology, Japan;
Jiro Makimoto, Koichiro Sawa, Keio University, Japan
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Abstract 7:2
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7:3
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Research on the Analytical Method of Contact Vibration
Performance of Reed Relay
ZHAI Guofu, REN Wanbin, XU Feng, Harbin Institute of Technology, China
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Abstract 7:3
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7:4
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Research on the Relationship between Contact Breakaway
Initial Velocity and Arc Duration
LIANG Huimin, MA Guangcheng, CAI Ling, Harbin Institute
of Technology, China; XIE Yong, XIE Guoqiang, Guilin Aerospace Apparatus
Company, China
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Abstract 7:4
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7:5
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Testing of Low-Current Contacts Quality and Reliability
by Using Third Harmonic Distortion
Karel Hajek, Military Academy, Czech Republic; Josef Sikula,
Brno University of Technology, Czech Republic
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Abstract 7:5
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7:6
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Particle Impact Noise Detection in Sealed Relays Based
on Neural Network
MA Guangcheng, YI Guoxing, WEN Qiyong, WANG Changhong, Harbin Institute of Technology,
China
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Abstract 7:6
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Coffee Break
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10:00-10:20
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8
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Session 8 - MEMS and Hybrids (Milenko Braunovic /
Mike Myers)
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10:20-11:40
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8:1
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Hybrid Micromachined
Push-Button Switches
Kai Hiltmann, Eugen
Wolf, Hermann Sandmaier, HSG-IMIT, Germany
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Abstract 8:1
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8:2
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Contact
Properties of Micromachined Ni Probes
T. Itoh, S. Kawamura, K. Kataoka, T. Suga, University of
Tokyo, Japan
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Abstract 8:2
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8:3
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Development
of Low-force Copper Contact Processes
Kenichi Kataoka, Toshihiro Itoh, Katsuya Okumura,
Tadatomo Suga, University of Tokyo, Japan
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Abstract 8:3
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8:4
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Contact
Resistance Characteristics of High Temperature Superconducting Bulk – II
Naoki Yamamoto, Takuya Imaizumi, Koichiro Sawa, Keio
University, Japan; Masaru Tomita, Railway Technical Research Institute,
Japan; Masato Murakami, ISTEC-Superconductivity Research Laboratories,
Japan
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Abstract 8:4
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Back to Final Program Front
Back to TC-1 Home
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