2005 IEEE Holm Conference Abstracts
Abstract # Date Fnl Abs Rec'd Paper Title First Name Last Name All Authors Comments Organization Address 1 Address 2 City State Zip Country Phone Fax Email Review Coordinator Review Email
1   The Driving Force and Mechanism for Spontaneous Metal Whisker Formation Michel Barsoum Michel Barsoum, Drexel University, PA   Drexel University Materials Science and Engineering 32 and Chesnut Philadephia PA 19104 USA 215 895 2338 215 895 6760 barsoumw@drexel.edu Brett Rickett BRickett@molex.com
2   Fretting Effects on the Contact Resistance of Intrinsically Conducting Polymers Yuzhi Lam     University of Southampton School of Engineering Science, Highfield   Southampton   SO17 1BJ United Kingdom 44-2380-592339   lizalam@mech.soton.ac.uk Pat Lees philip.lees@verizon.net
3   Displacement Measurements at the Connector Contact Interface Employing a Novel Thick Film Sensor Yuzhi Lam     University of Southampton School of Engineering Science, Highfield   Southampton   SO17 1BJ United Kingdom 44-2380-592339   lizalam@mech.soton.ac.uk Brett Rickett BRickett@molex.com
4   Improvement of Functional Properties of Ordered Alloys Based on Pd and Au Volkov Alexei     Ural Branch of RAS Institute of Metal Physics 18 S.Kovalevskaya St. Ekaterinburg   620219 Russian Federation 7-343-3744054 7-343-3745244 volkov@imp.uran.ru Ed Smith esmith@jmney.com
5   The Euivalent Constriction Resistance and Film Resistance under the Influence of Frittings EISUKE TAKANO       1-4-1 Izumigaoka Izumiku   Sendai   981 3201 Japan 81 22 374 3579 81 22 374 3579 eitakano@h8.dion.ne.jp John Shea JohnJShea@eaton.com
6   Lubrication of Electrical Contacts Bella Chudnovsky     Schneider Electric/Square D Engineering 9870 Crescent Park Dr. West Chester OH 45069 USA 513-755-4249 513-755-5013 bella.chudnovsky@us.schneider-electric.com Brett Rickett BRickett@molex.com
7   Occurrence of SiO2 on the Contact Surface and its Dependence of Electrode. Terutaka Tamai     Hyogo University of Teacher Education Electronics Institute 942-1 Shimokume, Yashiro-cho, Kato-gun, Hyogo 673-1494 Japan 81-795-44-2175 +81-795-44-2175 or 2189 tamai@life.hyogo-u.ac.jp Jerry Witter Wittergd@aol.com
8   Study of Test Method and Analysis on Accelerated Storage life Test for Electromagnetic Relays Yanyan Luo     Hebei University of Technology Electrical Apparatus Institute Dingzigu No.1 Road  Hongqiao District Tianjin   300130 P.R.China 86-22-26549256 86-22-26549256 ea_inst@hebut.edu.cn Chi Leung cleung@amidoduco.com
9   The Influence of Contact Interface Characteristics on Vibration-Induced Fretting Degradation George Flowers     Auburn University Mechanical Engineering 201 Ross Hall Auburn AL 36849-5341 USA 3348443330 3348443307 gflowers@eng.auburn.edu Pat Lees philip.lees@verizon.net
10   Research on the Relationships among Contact Breakaway Initial Velocity, Bridge and Metallic Phase Arc LIANG Huimin     Harbin Institute of Technology Electrical Engineering Department P.O. Box #401 Harbin   150001 China 86-451-86413964 86-451-86229631 lhm430@hotmail.com Jerry Witter Wittergd@aol.com
11   Intermittency Events in Bio-Compatible Electrical Contact John McBride     Univesity of Southampton School of Engineering Sciences Highfield Southampton   SO17 1BJ United Kingdom 44 23 80 59 2895   jwm@soton.ac.uk Chi Leung cleung@amidoduco.com
12   The Loaded Surface Profile: A new technique for the investigation of contact surfaces John McBride     Univesity of Southampton School of Engineering Sciences Highfield Southampton   SO17 1BJ United Kingdom 44 23 80 59 2895   jwm@soton.ac.uk Ed Smith esmith@jmney.com
13   Cathode Spot Behavior on Tungsten-Copper Contacts in Vacuum and the Effect on Erosion Erik Taylor     Eaton Cutler-Hammer 200 Westinghouse Circle   Horseheads NY 14845 USA 607-796-3372   erikdtaylor@eaton.com Chi Leung cleung@amidoduco.com
14   Application of Finite Element Analysis for Calculation of an Insulation Displacement Process Stefan Joergens     LumbergConnect GmbH&Co.KG R&D Im Gewerbepark 2 Schalksmühle   D-58579 Germany 49235583554 49235583587 joergens.stefan@lumberg.de George Drew george.drew@delphi.com
15   A Novel Concept Utilizing Conductive Polymers on Power Connectors to Dissipate Arcing Energy During Hot Swapping in Live Modular Electronic Systems Trent Do     Teradyne Connection Systems Development Engineering 44 Simon St., MS-006 Nashua NH 03060 USA 603-879-3113   trent.do@tcs.teradyne.com Thomas Schoepf thomas.j.schoepf@delphi.com
16   Failure Analysis of Lamp Switch Richard Kertesz     Hoffmann & Feige 3 Fallsview Lane Croton River Executive Park Brewster NY 10509 USA 845-277-4401 845-277-4701 metalmen@hoffmann-feige.com Phil Wingert phil.wingert@earthlink.net
17   Power Rating Connectors using Voltage Drop Robert Malucci     RD Malucci Consulting 317 Prairie Knoll   Naperville IL 60565 USA 630 624 4465   bmalucci@molex.com John Shea JohnJShea@eaton.com
18   The deterioration properties of screwed electric contacts damaged by mechanical vibration Youngseok Kim     Korea Electrical Safety Corporation 27 Sangcheon-ri Oeseo-myeon   Gapyeonggun Gyeonggido 477-814 Korea 82-31-580-3042 82-31-580-3045 athens9@hanmail.net Xin Zhou XinZhou@eaton.com
19   Finite element analysis of magnetic structures for Micro-Electro-Mechanical Relays REN Wanbin     Harbin Institute of Technology Electrical Engineering and Automation P.O.Box 401 Harbin Heilongjiang 150001 China 86-451-86412976 86-451-86229631 renwanbin@yahoo.com.cn Richard Moore richard.moore@itt.com
20   Development of The Lead-Free Brush Material for Starters Ryoichi Honbo     DENSO CORPORATION Materials Eng. R&D Dept. 1-1 Showa-cho Kariya Aichi 448-8661 Japan 81-566-25-7763 81-566-25-4619 ryoichi_honbo@denso.co.jp Steve Cole scole@moog.com
21   Consecutive Observations of the Relationship between Eroded Contact Surfaces and Motion of Breaking Arc at Each Breaking Operation Junya Sekikawa     Shizuoka University Faculty of Engineering Johoku 3-chome Hamamatsu   432-8561 Japan 81-53-478-1618 81-53-478-1138 tjsekik@ipc.shizuoka.ac.jp Phil Wingert phil.wingert@earthlink.net
22   Micro Phenomena in Low Contact-Force Probing on Aluminum Kenichi Kataoka     University of Tokyo Research Center for Advanced Science and Technolog 4-6-1 Komaba, Meguro-ku Tokyo   153-8904 Japan 81-3-5452-5182 81-3-5452-5323 kataoka@su.rcast.u-tokyo.ac.jp Milenko Braunovic mbinterface@yahoo.com
23   Low contact-force LSI probing utilizing removable conductive materials Kenichi Kataoka     University of Tokyo Research Center for Advanced Science and Technolog 4-6-1 Komaba, Meguro-ku Tokyo   153-8904 Japan 81-3-5452-5182 81-3-5452-5323 kataoka@su.rcast.u-tokyo.ac.jp Pat Lees philip.lees@verizon.net
24   Synthesis and characterization of Ti-Si-C ternary compounds for electrical contact applications Per Eklund     Linköping University IFM, Dept. of Physics Thin Film Physics Division Linköping   SE-581 83 Sweden 46 (0)13 28 57 93   perek@ifm.liu.se Jerry Witter Wittergd@aol.com
25   Time-coordinated Operation of Reed Switches for Higher Current Wakatsuki Noboru     Ishinomaki Senshu University Science 1 Sinmito, Minamisakai Ishinomaki   986-8580 Japan 81-225-22-7716 81-225-22-7746 wakatuki@isenshu-u.ac.jp Richard Moore richard.moore@itt.com
26   Micro motion at the failed contact interfaces Zhanping He     Beijing University of Posts & Telecommunications mail box: 71#   Beijing   100876 China 86-10-62283005   hezhanping@sohu.com Z.K. Chen Chensun@aol.com
27   New algorithm for volumetric analysis of contact damages with laser microscope data Makoto Hasegawa     Chitose Institute of Science & Technology 758-65 Bibi   Chitose Hokkaido 066-8655 Japan 81-123-27-6059 81-123-27-6059 hasegawa@photon.chitose.ac.jp Ed Smith esmith@jmney.com
28   Study of consequences caused by molten bridge phenomena on power contacts thomas klonowski     Laboratoire de genie electrique 11 rue joliot curie   gif sur yvette   91190 France 33 169851691   klonowski@lgep.supelec.fr Xin Zhou XinZhou@eaton.com
29   Inspection of the contaminants at failed connector contacts Cuifeng Feng     Beijing University of Posts & Telecommunications mail box: 71#   Beijing   100876 China 86-10-62283005 86-10-62283173 guisir@sohu.com Robert Malucci bmalucci@molex.com
30   The “selective” deposition of particles on electric contact and their effects on contact failure Jinchun Gao     Beijing University of Posts & Telecommunications mail box: 71#   Beijing   100876 China 86-10-62283222 86-10-62283173 gjc@bupt.edu.cn Chi Leung cleung@amidoduco.com
31   A mechanical, electrical, thermal coupled-field simulation of a sphere-plane electrical contact Arnaud Monnier     Laboratoire de Génie Electrique de Paris (LGEP) 11,rue Joliot Curie, Plateau du Moulon   Gif sur Yvette   91190 France 33169851691   monnier@lgep.supelec.fr Xin Zhou XinZhou@eaton.com
32   The Evolution of Contact Erosion during an Opening Operation at 42V Jonathan Swingler     University of Southampton School of Engineering Sciences Highfield Southampton Hants SO17 1BJ United Kingdom 44 23 8059 5479   jonathan@swingler.net Z.K. Chen Chensun@aol.com
33   New conductive Ti-Si-C ceramic for electrical contact applications Peter Isberg     ABB Corporate Research Power Technologies Forskargrand 6 Vasteras   S-721 78 Sweden 46-21-323197 46-21-323264 peter.isberg@se.abb.com Jerry Witter Wittergd@aol.com
34   The influence of tangential movement, load and contact material on the separation force of low current switching contacts Alexander Neuhaus     AC2T research GmbH Schalterbau Viktor Kaplan Str. 2 Wiener Neustadt   02700 Austria 43-2622-81600-34 43-2622-81600-99 neuhaus@ac2t.at Richard Moore richard.moore@itt.com
35   Modelling and management of microshocks under high voltage transmission lines Aruna Gunatilake     The University of Manchester School of Electrical  & Electronic Engineering PO Box 88, Sackville Street Manchester   M60 1QD United Kingdom 44--161-200-4679 44-161-200-4820 a.gunatilake@postgrad.manchester.ac.uk Milenko Braunovic mbinterface@yahoo.com
36   Insertion and Withdrawal Forces for Printed Circuit Board and Heavy Duty Connectors Horst Nowacki     HARTING KGaA Marienwerderstraße 2   Espelkamp   32339 Germany 49 5772 47 292   horst.nowacki@Harting.com George Drew george.drew@delphi.com
37   Vibration-Induced Deterioration of Tin-Coated Connectors Studies by Using a Force Controlled Fretting Bench-Test Tag Hammam     Swedish Institute for Metals Research Drottning Kristinas v. 48   Stockholm   SE-114 28 Sweden 46 8 440 48 72 46 8 440 45 35 tag.hammam@simr.se Brett Rickett BRickett@molex.com
38   Pore Corrosion Model for Plated Copper Contacts Amy Sun     Sandia National Laboratories Multiphase Transport Processes P.O.Box 5800 MS0834 Albuquerque NM 87122 USA 505-284-5861 505-8448251 acsun@sandia.gov Robert Malucci bmalucci@molex.com
39   Contact Resistance Characteristics of High Temperature Superconducting Bulk - IV Hiroyuki Fujita     Keio University 3-14-1 Hiyoshi, Kohoku-ku   Yokohama   223-8522 Japan 81-45-563-1151   h-fujit@sum.sd.keio.ac.jp Milenko Braunovic mbinterface@yahoo.com
40   Multi-scale study of the electrical properties of organic layers grafted on gold surfaces noel sophie     supelec lgep 11 rue joliot curie gif sur yvette   91190 France 33 1 69 85 16 43   noel@lgep.supelec.fr Pat Lees philip.lees@verizon.net
41   An Examination of the Upper Temperature Limit for the Application of Tin Coated Connectors Philip Lees     Technical Materials, Inc. New Product Development 5 Wellington Road livonia RI 02865 USA 4012880675 4013332848 Philip_Lees@beminc.com Robert Malucci bmalucci@molex.com
42   Performance Comparisons Between a Newly Designed Connector and a Twist-on Connector Used for Aluminum to Copper Wiring. Sherry Harrison     King Innovation Marketing 3801 Lloyd King Drive Saint Charles MO 63304 USA 636-519-5457 535-519-5410 sharrison@kinginnovation.com Eric Taylor erikdtaylor@eaton.com
43   Characteristics of a sliding system with Au plating slip-ring and AgPd brush for power supply Koichiro Sawa     Keio University Faculty of Science & Technology 3-14-1 Hiyoshi, Kohoku-ku Yokohama   223-8522 Japan 81-45-563-1141 81-15-566-1721 sawa@sd.keio.ac.jp Steve Cole scole@moog.com
44   An Investigation for Early Lifetime Prediction of Ag-Ni Contacts for Electromagnetic Contactor Yosuke Kawakami     Keio University 3-14-1, Hiyoshi, Kohoku-ku, Yokohama, Japan   Yokohama   223-8522 Japan 045-563-1151   y-kawa@sum.sd.keio.ac.jp Phil Wingert phil.wingert@earthlink.net
45   Simulation of Current and Heat Transfer at Multiple-Point Contacts and Electrodes Space Partition to Current Tubes of Individual Spots Vadim Samoilov     J.S.Co. Contactor Scientific Research Department K.Marx str., 12 Goncharov str., 22-16 Ulyanovsk 432001 Russia 7 8422 490106   samoilov_vadim@mail.ru Thomas Schoepf thomas.j.schoepf@delphi.com
46   Spatial Distribution of Electric Field Strength in Circuit Breaker Arc Chute Depending on Its Geometry Vadim Samoilov     J.S.Co. Contactor Scientific Research Department K.Marx str., 12 Goncharov str., 22-16 Ulyanovsk 432001 Russia 7 8422 490106   samoilov_vadim@mail.ru John Shea JohnJShea@eaton.com
47   Effect of Thermal Aging on Fretting Behaviour of Lead-Free Systems Daniel Gagnon     Hydro Quebec IREQ Mécanique, métallurgie et civil 1800 Lionel Boulet Varennes Quebec J3X1S1 Canada 450-652-8396 450-652-8181 gagnon.daniel@ireq.ca Ed Smith esmith@jmney.com
48   The Effect of Electrical Current on the Friction Behaviour of Electrical Contact Daniel Gagnon     Hydro Quebec IREQ Mécanique, métallurgie et civil 1800 Lionel Boulet Varennes Quebec J3X1S1 Canada 450-652-8396 450-652-8181 gagnon.daniel@ireq.ca Z.K. Chen Chensun@aol.com
49   The Effects of Surface Contamination on Resistance Degradation of Hot-Switched Low-Force MEMS Electrical Contacts Daniel Dickrell     Hydro Quebec IREQ Mécanique, métallurgie et civil 1800 Lionel Boulet Varennes Quebec J3X1S1 Canada 450-652-8396 450-652-8181 gagnon.daniel@ireq.ca George Drew george.drew@delphi.com
50   Electrochemical Migration of Land Grid Array Sockets Under Highly Accelerated Stress Conditions Ji Wu     University of Maryland Rm 1105, Engineering Lab Building   College Park MD 20742 USA 3014055901 3013149269 jwu@calce.umd.edu George Drew george.drew@delphi.com
51   Performance Classification for Electrical Connections Using ASTM B868 Jesse Aronstein     Consulting Engineeer 50 Pasture Lane   Poughkeepsie NY 12603 USA 845-462-6452   protune@aol.com Milenko Braunovic mbinterface@yahoo.com
52   Characteristics of Carbon Flat Commutator for High-Inductance DC Motor Driving Automotive Fuel Pump Takashi Shigemori     Keio University 3-14-1 Hiyoshi Kohoku-ku   Yokomaha   223-8522 Japan 81-45-563-1141   shigemori@sum.sd.keio.ac.jp Thomas Schoepf thomas.j.schoepf@delphi.com
53   Multi-Spot Model Showing the Effects of Nano-Spot Sizes Robert Malucci     RD Malucci Consulting 317 Prairie Knoll   Naperville IL 60565 USA 630 624 4465   bmalucci@molex.com Eric Taylor erikdtaylor@eaton.com
54   Factors Influencing Upon Change of the Vacuum Arc Mode Alexander Sokolov     Tavrida Electric 1,Marshal Birjuzov str   Moscow   123298 Russia 7 095 7872525 7 095 9431295 saa@tavrida.ru Eric Taylor erikdtaylor@eaton.com
55   Deflection Analysis of Spring Connector ROCHDI ELABDI     University of Rennes1 IUT de Rennes. 3 Rue du Clos Courtel BP.90422   Rennes   35704 France 33 2 23 23 41 12 33 2 23 23 41 01 relabdi@univ-rennes1.fr Richard Moore richard.moore@itt.com
56   Contact Heating by Long Arcing During Connector Disconnection PORTE Maxime     University of Rennes1 PALMS Campus de Beaulieu Bat11B RENNES   35042 France 33223236117   maxime.porte@univ-rennes1.fr Thomas Schoepf thomas.j.schoepf@delphi.com
57   Arc Study at High DC Current Level in Automotive Applications Benjemaa Noureddine     University of Rennes1 Campus of Beaulieu   RENNES   35042 France 33223236193   benjemaa@univ-rennes1.fr Bill Balme billbalme@checon.com
58   Comparison of Brush Contact Drop Characteristics with Cupper Ring and Steel Ring, Considering Spark and Collector Ring Hazard Takahiro Ueno     Nippon Institute of Technology 4-1,Gakuendai,Miyashiro,Minami Saitama   Saitama   345-8501 Japan 81-480-33-7667 81-480-33-7565 ueno@nit.ac.jp Steve Cole scole@moog.com
59   Influence of Surface Roughness on Contact Voltage Drop of Sliding Contacts Takahiro Ueno     Nippon Institute of Technology 4-1,Gakuendai,Miyashiro,Minami Saitama   Saitama   345-8501 Japan 81-480-33-7667 81-480-33-7565 ueno@nit.ac.jp Steve Cole scole@moog.com
60   Substitution of Silver/cadmium oxide in High Voltage Disconnectors Christian Bernauer     Ruhrtal Hochspannungsgeräte Engineering Hohensteinstr. 16 Bochum   D-44866 Germany 49-2327-996-153   christian.bernauer@siemens.com Bill Balme billbalme@checon.com
61   In-Situ Measurement of the Relative Movement of Connector Terminals Yuzhi Lam     University of Southampton School of Engineering Science, Highfield   Southampton   SO17 1BJ United Kingdom 44-2380-592339   lizalam@mech.soton.ac.uk Brett Rickett BRickett@molex.com
62   Conditions for Series Arcing Phenomena in PVC Wiring John Shea     Eaton Electrical 170 Industry Dr.   Pittsburgh PA 15275 USA 4124943067   johnjshea@eaton.com Henry Czajkowski hvczajkowski@ra.rockwell.com
63   Long-Term High Resolution Wear Studies of High Current Density Electrical Brushes Martin Jensen     Vestas Wind Systems A/S and University of Aarhus Department of Physics and Astronomy Paludan Mullers Vej 82 Aarhu   08200 Denmark 45 20 45 92 57   mvsj@vestas.com George Drew george.drew@delphi.com
64   A Study of Microcosmic Models of Equilibrium and Non-Equilibrium Arc ChunYan Zang     Huazhong University of Science & Technology College of Electric and Electronics Engineering   Wuhan   430074 China 86-27-87543528 86-27-87544242 zcy_peace@tom.com Eric Taylor erikdtaylor@eaton.com
65   A Model for Life Time Evaluation of Electrical Contacts Milenko Braunovic     MB Interface 5975 place de l'Authion Suite 503 Montreal Quebec H1M 2W3 Canada 514-354-7942 514-354-9869 mbinterface@yahoo.com Robert Malucci bmalucci@molex.com
66   Counter-Measures for Relay Failures Due to Dynamic Welding: A Robust Engineering Design Thomas Schoepf     Delphi Research Labs 51786 Shelby Parkway   Shelby Twp MI 48315 USA 5863230606 5863239797 thomas.j.schoepf@delphi.com Z.K. Chen Chensun@aol.com
67   Effect of Short Circuit Current Duration on the Welding of Closed Contacts in Vacuum in Vacuum Paul Slade     Eaton Electrical                   Phil Wingert phil.wingert@earthlink.net
68   Asynchronous Modular Contactors with Intelligent Technology for Motor Control Applications Xin Zhou     Eaton Corporatin Innovation Center 4201 N 27th Street Milwaukee WI 53216 USA 414-449-6045 414-449-6332 xinzhou@eaton.com Henry Czajkowski hvczajkowski@ra.rockwell.com
69   Contact Erosion of Ag/SnO2/In2O3 and Ag/SnO2 Chi Leung     AMI DODUCO 1003 Corporate Lane   Export PA 15632 USA     cleung@amidoduco.com Jerry Witter Wittergd@aol.com
70   The effect of silver composition and additives on switching characteristics of silver tin oxide type contacts for automotive inductive loads G. Witter     Chugai USA, Inc. 3780 Hawthorn Ct.   Waukegan IL 60087 USA 847-244-6025 847-244-6041 g.witter@ieee.org Bill Balme billbalme@checon.com
71   The Effect of Load Type on Resistance Results for Silicone Contaminated Contacts in Automotive Load G. Witter     Chugai USA, Inc. 3780 Hawthorn Ct.   Waukegan IL 60087 USA 847-244-6025 847-244-6041 g.witter@ieee.org Henry Czajkowski hvczajkowski@ra.rockwell.com
72   High Temperature Resistant Galvanic Deposited Gold Layers for Switching Contacts Werner Johler     Tyco Electronics AXICOM Seestrasse 295   Waedenswil   CH 8804 Au Switzerland 41 1 782 9151 41 1 782 9000 werner.johler@tycoelectronics.com Xin Zhou XinZhou@eaton.com