|
Technical Program
Arc Interruption I
1.1 Low-voltage
arc simulation with out-gassing polymers
Christian
Rümpler, Fraunhofer Institute SCAI, Germany; Hartwig Stammberger, Eaton
Industries
GmbH, Germany;
and Albert Zacharias, Eaton Industries GmbH, Germany
1.2 Experimental
investigation of the interaction of interrupting arcs and gassing polymer
walls
Diego
Gonzalez, Technische Universitaet Ilmenau, Germany;Heinz Pursch, Eaton
Industries GmbH, Germany; and Frank Berger, Technische Universitaet
Ilmenau, Germany
1.3 Influence
of Voltage and Current on Arc Duration and Energy of DC Electromagnetic
Contactor
Kiyoshi
Yoshida, Nippon Institute of Technology, Japan; Koichiro Sawa, Nippon
Institute of Technology, Japan; Kenji Suzuki, Fuji Electric FA Components
& Systems Co., Ltd., Japan; Masaaki Watanabe, Fuji Electric FA Components
& Systems Co., Ltd., Japan; and Hideki Daijima, Fuji Electric FA
Components & Systems Co., Ltd., Japan
Young Investigator Award
2.1 A
Preliminary Investigation of Graphite, Graphene and Carbon Nanotubes
(CNT's) As Solid State Lubricants
Andrew Loyd, TE Connectivity, United
States;Jessica Hemond, TE Connectivity, United States; and Rod Martens,
TE Connectivity, United States
2.2 Contact
Resistance with Dissimilar Materials: Bulk Contacts and Thin Film
Contacts
Peng Zhang, University of Michigan - Ann Arbor,
United States;Y. Y. Lau, University of Michigan - Ann Arbor, United
States;W. Tang, Air Force Research Laboratory, United States;M. R. Gomez,
Sandia National Laboratories, United States;D. M. French, Air Force
Research Laboratory, United States;J. C. Zier, Naval Research Laboratory,
United States; and R. M. Gilgenbach, University of Michigan - Ann Arbor,
United States
2.3 Arc
Fault Model of Conductance. Application to the UL1699 Tests Modeling
Jonathan
ANDREA, esterline, France;patrick schweitzer, lien, France; and JM
Martel, SIEMENS, Germany
2.4 High
current arc erosion on copper electrodes in air
Thomas
Øyvang, Telemark University College, Norway;Elin Fjeld, Telemark
University College, Norway;Wilhelm Rondeel, Telemark University College,
Norway; and Svein Thore Hagen, Telemark University College, Norway
2.5 Whisker
Growth Under Controlled Humidity Exposure
Erika
Crandall, Auburn University, United States; George Flowers, Auburn
University, United States; Pradeep Lall, Auburn University, United
States; and Michael Bozack, Auburn University, United States
Fundamentals
3.1 The
Effects of Current Density Variations in Power Contact Interfaces
Robert Malucci, RD Malucci Consulting, United
States
3.2 Direct
Observation of Current Density Distribution in Contact Area by Using
Light Emission Diode Wafer
Shigeru Sawada, Mie Univ., Japan;
Shigeki Tsukiji, Mie Univ., Japan; Terutaka Tamai, AutoNetworks
Technologies, Ltd., Japan; Yasuhiro Hattori, AutoNetworks Technologies,
Ltd., Japan; and kazuo Iida, Mie Univ., Japan
3.3 Effect
of Contact Parameters on Current Density Distribution in a Contact
Interface
Marjorie
Myers, TE Connectivity, United States;Michael Leidner, TE Connectivity,
Germany; and Helge Schmidt, TE Connectivity, Germany
Fretting
4.1 Fretting
behavior of nickel coatings for electrical contact applications
Sophie Noël, Supelec, France; David Alamarguy,
Supelec, France; Sandra Correia, Supelec, France; and Pierre Laurat,
Legrand, France
4.2 Research
on fretting resistance and fretting wear property of Ni-Au contact pair
Xue-Yan
Lin, Research Lab of Electrical Contacts, BUPT, China;Liang-Jun Xu,
Research Lab of Electrical Contacts, BUPT, China;Yan-Chao Shao, Research
Lab of Electrical Contacts, BUPT, China; and Guo-Ping Luo, Nokia
Coorperation, Finland
4.3 Measurement
of Contact Resistance Distribution in Fretting Corrosion Track for the
Tin Plated Contacts
Soushi Masui, Mie Univ.,
Japan;Shigeru Sawada, Mie Univ., Japan;Terutaka Tamai, AutoNetworks Technologies,
Ltd., Japan;Yasuhiro Hattori, AutoNetworks
Relays
/ Arcing
5.1 Contact
resistance characteristics of relays operated in
silicone-vapor-containing and non-silicone atmospheres with different
electrical load conditions
Makoto Hasegawa, Chitose Institute of
ScienceTechnology, Japan;Nanae Kobayashi, Chitose Institute of
ScienceTechnology, Japan; and Yoshiyuki Kohno, Kaneka Corporation, Japan
5.2 Evaluation
of contact surface damages with an optical cross-section method
Makoto Hasegawa, Chitose Institute of
ScienceTechnology, Japan; and Keisuke Takahashi, Chitose Institute of
Science and Technology, Japan
5.3 The Effect
of mechanical parameters of switch-type contact on relay operation
characteristics
Wanbin Ren, Harbin Inst. of Tech., China;Songjun
Ma, Harbin Inst. of Tech., China;Guofu Zhai, Harbin Inst. of Tech.,
China; and Huadong Xu, Beijing GO-WELL
5.4 Development
of Contact Material Solutions for Low-Voltage Circuit Breaker
Applications (2)
Timo Mützel, Umicore AG & Co. KG, Germany;
and Ralf Niederreuther, Umicore AG & Co. KG, Germany
5.5 Transient
Phenomena from Melting to Electric Discharge during Making and Breaking
Operations of Electric Contacts
Noboru Wakatsuki, Ishinomaki Senshu Univ.,
Japan;Takayuki Kudou, Ishinomaki Senshu Univ., Japan; and Nobuo Takatsu,
Ishinomaki Senshu Univ., Japan
Arc Fault / Electrical Safety
6.1 RF
Current Produced from Electrical Arcing
John Shea, Eaton Corporation, United
States; and Jason Carrodus, Eaton Corporation, United States
6.2 Method
to Design Arc Fault Detection Algorithm using FPGA
Michaël Rabla, Université Henri
Poincaré, France; and Patrick Schweitzer, Université Henri Poincaré,
France
6.3 Influence
of Capacitive and Inductive Loads on the Detectability of Arc Faults
Peter Müller, University of
Stuttgart, Germany;Stefan Tenbohlen, University of Stuttgart,
Germany;Reinhard Maier, Siemens AG, Germany; and Michael Anheuser,
Siemens AG, Germany
6.4 Characteristics
of Overheated Electrical Joints due to Loose Connection
Xin Zhou, Eaton Corporation, United States; and
Thomas Schoepf, Eaton Corporation, United States
Mort Antler Lecture
Modern Design of Experiments (DOE) After 75 Years
of Advancements in Multifactor Test Methods
Mark Anderson,
Principal and General Manager, Stat-Ease Inc.
Modelling
7.1 Numerical
study of asperity distribution in an electrical contact
Per
Lindholm, ABB Corporate Research, Sweden
7.2 Computational
Modeling and Analysis of a Contact Pair for the Prediction of Fretting
Dependent Electrical Contact Resistance
Keiji
Mashimo, Furukawa Electric co., ltd., Japan; and Yasuyuki Ishimaru, FITEC
Corp., Japan
7.3 A Discrete
analysis of gold surface asperities deformation under spherical
nano-indentation towards electrical contact resistance calculation
Brice Arrazat, Centre
Microélectronique de Provence - Georges Charpak, Ecole Nationale
Supérieure des Mines de Sain, France; Pierre-Yves Duvivier, CEA, Leti,
Minatec, Grenoble, France, France; Vincent Mandrillon, CEA, Leti,
Minatec, Grenoble, France, France; and Karim Inal, Centre
Microélectronique de Provence - Georges Charpak, Ecole Nationale
Supérieure des Mines de Sain, France
7.4 The
Effect of Coil on Combined Three-Subsection Permanent Magnet in Close
Magnetic Circuit Model
You
Jiaxin, Harbin Institute of Technology, China; Liang Huimin, Harbin
Institute of Technology, China; Ye Xuerong, Harbin Institute of
Technology, China; and Zhai Guofu, Harbin Institute of Technology, China
MEMS/Micro-Contact
8.1 Gold
Coated Carbon-Nanotube Surfaces as Low Force Electrical Contacts for MEMS
devices: Part II, Fine Transfer Mechanisms
John McBride, University of Southampton, United Kingdom; Mark
Spearing, University of Southampton, United Kingdom; Liudi Jiang,
University of Southampton, United Kingdom; and Chamaporn Chianrabutra,
University of Southampton, United Kingdom
8.2 A
Nano-scale Investigation of Material Transfer Phenomena at Make in a MEMS
switch
Christophe
Poulain, CEA-LETI, France;Alexis Peschot, CEA-LETI, France;Maxime
Vincent, University of California, Berkeley, United States; and Nelly
Bonifaci
8.3 Compliant
Carbon Nanotube-Metal Contact Structures
Onnik Yaglioglu, Massachusetts Institute of Technology,
United States;Rod Martens, Massachusetts Institute of Technology, United
States;Anyuan Cao, Peking University, China; and A. H. Slocum,
Massachusetts Institute of Technology, United States
Connector Degradation I
9.1 A
Summary Report on the Mechanism of Electric Contact Failure due to
Particle Contamination
Ji Gao Zhang, Emeritus Professor, China
9.2 Correlation
of Intrinsic Thin Film Stress Evolution and IMC Growth with Whisker
Growth
Chad
Rodekohr, Presbyterian College, United States;George T. Flowers, Auburn
University, United States;Michael J. Bozack, Auburn University, United
States;Rob Jackson, Auburn University, United States;Rod Martens, TE
Connectivity, United States;Zhijun Zhao, Western Digital, United
States;Erika Crandall, Auburn University, United States;Vern Starman, Air
Force Institute of Technology, United States;Thomas Bitner, Presbyterian
College, United States; and Jacob Street, Presbyterian College, United
States
9.3 A
Study on Mobile Communication Device Structure Design Resisting Dust
Particles Ingress
Na
Lu, Beijing University of Posts and Telecommunications, Beijing, China
Arc Interruption
10.1 A
Study of arc duration on supple carbon contacts in the automotive field
Jerome Praquin, Renault, France; Chistophe
Gautherot, Renault, France; Jean Rivenc, Renault, France; Nourredine Ben
Jemaa, University of Rennes, France
10.2 Effects
of rotational motion of break arcs on arc duration and contact erosion
Junya
Sekikawa, Shizuoka University, Japan; and Takayoshi Kubono, Shizuoka
University, Japan
10.3 AC
Electrical Arcs With Graphite Electrodes
Erwann
Carvou, Universite de Rennes 1, France;Brian Mitchell, Universite de
Rennes 1, France;Noureddine Ben Jemaa, Universite de Rennes 1,
France;Simon Tian, Schneider Electric, France; and Zakaria Belhaja,
Schneider Electric, France
High Power Sliding/Contact
Resistance
11.1 Effect
of Lubricant on Degradation Process of Au-plated Slip-Ring and Ag-Pd
Brush System for Small Electric Power
Koichiro Sawa, Nippon Institute of Technology,
Japan;Yasunori Suzuki, Nippon Institute of Technology, Japan;Noboru
Morita, Nippon Institute of Technology, Japan;Takahiro Ueno, Nippon Institute
of Technology, Japan; and Kaoru Endo, Nideco Servo Corporation, Japan
11.2 Pantograph
Arc's Energy Characters Under Various Load
Bo Wang, Southwest Jiaotong University, China;
Guangning Wu, Southwest Jiaotong University, China; Lijun Zhou, Southwest
Jiaotong University, China
11.3 Pantograph
Arcing's Impact on Locomotive Equipments
Tianzhi
Li, Southwest Jiaotong University, China;Guangning Wu, Southwest Jiaotong
University, China;Lijun Zhou, Southwest Jiaotong University,
China;Guoqiang Gao, Southwest Jiaotong University, China;Wangang Wang,
Southwest Jiaotong University, China;Bo Wang, Southwest Jiaotong
University, China;Donglai Liu, Southwest Jiaotong University, China; and
Dajian Li, Southwest Jiaotong University, China
11.4 An
Experimental Study to show the behavior of Electrical Contact Resistance
and Coefficient of Friction at Low Current Sliding Electrical Interfaces
Siddeswara
Prasad Veeranna, Siddaganga Institute of Technology, India;Prashant
Misra, Indian Institute of Science Bangalore, India; and Nagaraju
Jampana, Indian Institute of Science Bangalore, India
Sliding
12.1 There
is tin and there is tin – characterisation of tribological and electrical
properties of electroplated tin surfaces
Frank
Ostendorf, Weidmueller Interface GmbH & Co. KG, Germany;Thomas
Wielsch, Weidmueller Interface GmbH & Co. KG, Germany; and Michael
Reiniger, Weidmueller Interface GmbH & Co. KG, Germany
12.2 Study
on Characterization of Electrical Contact Between Pantograph and Catenary
Wangang Wang, Southwest Jiaotong University,
China; Anping Dong, Southwest Jiaotong University, China; Guangning Wu,
Southwest Jiaotong University, China; Guoqiang Gao, Southwest Jiaotong
University, China; Lijun zhou, Southwest Jiaotong University, China; Bo
wang, Southwest Jiaotong University, China; and Yi Cui, Southwest
Jiaotong University, China
12.3 The
Effect of Various Atmospheric Temperature on the Contact Resistance of
Sliding Contact on Silver Coating Slip Ring and Silver Graphite Brush
Emad
Barnawi, Nippon Institute of Technology, Japan; Koichiro Sawa, Nippon
Institute of Technology, Japan; Noboru Morita, Nippon Institute of
Technology, Japan; and Takahiro Ueno, Nippon Institute of Technology,
Japan
Connectors/Contact Resistance
13.1 Peculiar
Phenomenon in Friction Coefficient of Tin Plated Connector Contacts with
Application of Lubricant
Terutaka
Tamai, Elcontech consulting, Ltd., Japan; Shigeru Sawada, Mie University,
Japan; and Yasuhiro Hattori, AutoNetworks Technologies, Ltd., Japan
13.2 Stress
Analysis of Dust Particle on the Electrical Contact Surface
Yang
Lv, Electric Contact Lab Automation School Beijing University of
PostsTelecommunications, China; and Liangjun Xu, Electric Contact Lab
Automation School Beijing University of Posts and Telecommunications,
China
13.3 Stress-Strain
Response of Copper-based Spring Materials under Forward and Reverse
Deformations and Its Mathematical Description
Yasuhiro HATTORI, AutoNetworks
Technologies, Ltd., Japan;Kingo FURUKAWA, AutoNetworks Technologies,
Ltd., Japan; and Fusahito YOSHIDA, Hiroshima
Connector Degradation II
14.1 Growth
of Sn Whiskers Under Net Compressive and Tensile Stress States
Erika Crandall, Auburn University,
United States; George Flowers, Auburn University, United States; Robert Jackson,
Auburn University, United States; Pradeep Lall, Auburn University, United
States; and Michael Bozack, Auburn University, United States
14.2 Degradation
phenomena of electrical contacts using hammering oscillating mechanism
and micro-sliding mechanism- Contact resistance and its model
Shinichi
Wada, company, Japan; and Koichiro Sawa, university, Japan
14.3 The
Influence of the Organic Compounds on the Contaminated Electrical
Contacts
YILIN ZHOU, Beijing University of
PostsTelecommunications, China;YANG LV, Beijing University of
PostsTelecommunications, China; and HAO WANG, Beijing University of Posts
and Telecommunications, China
14.4 Selected
aspects of the electrical behavior in sliding electrical contacts
Christian Holzapfel, Schleifring und Apparatebau GmbH,
Germany
|
