Call for Participation

ASTR 2003

Workshop on Accelerated Stress Testing & Reliability

Sponsored by the IEEE/CPMT ASTR Committee and Technically co-sponsored by the IEEE Reliability Society

Oct 1 - 3, 2003

at the

The Renaissance Madison Hotel

Seattle, Washington

Over the last few years, Accelerated Stress Testing (AST) has been embraced by an ever widening array of worldwide companies seeking to reconcile the need for the highest quality product with the necessary push for early time-to-market. The purpose of the AST Workshop is to share ideas on better ways of accelerating and detecting hidden defects, flaws, and weaknesses in electronic and electro-mechanical hardware that would result in failures during usage. These techniques are focused on testing electronic hardware to destruction limits and root cause investigation to determine the physics-of-failure. The goal of AST is to produce mature products at market introduction and, in making it robust, the product can be screened for manufacturing defects with high combined stresses (beyond end-use specifications) for shorter lengths of time.

Registration information: Please click here to access the Adobe PDF formatted registration form for registration by check.

Online registration can be accessed by clicking HERE to go to the online registration page

Speakers Note: PowerPoint Templates to be used for the Speakers Bio can be accessed by clicking HERE and the Template for presentations, by clicking HERE : for Paper/ Presentation Deadlines: Abstract May 30, 2003 Draft June 30, 2003 Final July 30, 2003

Topics to be covered:

Click Here to go to proposed schedule

Advanced Approaches to AST
Electrodynamic vs. Repetitive Shock Vibration
Reliability Improvement Techniques
AST Data Collection/Analysis
Failure Analysis Techniques and Examples
Reliability Simulation and Modeling
Application of Physics of Failure Techniques
Stress Screening Techniques
AST Case Studies, including stress profiles
Stress other than temperature & vibration
Functional test During Stress Testing
AST Results on New Technologies
ESD

TUTORIALS: The all day tutorial program will be held on the first day of the Workshop and features well respected experts sharing their experiences and hard learned lessons. Two parallel sessions , Basic AST and Advanced AST Subjects, will ensure that experienced practitioners as well as those who are just entering the field will find useful and interesting presentations.

Tutorial Topics

Failure analysis
Design of Experiments
AST Procedures
AST Equipment
Mechanical AST
Thermal AST
Overall AST planning and management
Reliability of component packaging and/or assembly and/or systems
AST for specific systems: optoelectronic packaging, rf devices
Reliability of Specific systems
Emerging technologies and future systems, such as MCM, System in Packaging, microsystems, nanotechnologies, and their reliability
Other AST issues

Please email proposal to program chairs Paul Paroff at pparoff@advanced-input.com and John Proulx, at john.proulx@gm.com with copy to Tony Chan at h.a.chan@ieee.org.

TECHNICAL SESSIONS: The two day workshop program will present new and innovative Accelerated Stress Testing techniques in use today. Past workshops featured speakers discussing their accomplishments in providing accelerated reliability testing for a wide range of products as well as failure analysis techniques and data analysis.

Vendor Exhibits: Many suppliers of AST equipment, instruments, and services will be present during the first two days. Vendors currently scheduled to attend are:

Dytran, Thermotron, Team, Chart, Vibration Research, CSZ, Northwest Env. Test Lab, Hi-Rel Laboratories, C. Hanse Industries, Air Liquide, Controlled Environments Inc, VBS

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Hotel Information is available at http://www.themadison.com or http://www.marriott.com/dpp/PropertyPage.asp?MarshaCode=SEASM Our group room rate of $135 / night is good from September 26 through October 7, so you can explore Seattle on your own before or after the conference if you wish to. You must reserve the room by August 31, 2003 to qualify for this special rate.

Reservations for the hotel need to be made by individual attendees using one of the following:

Directly with Renaissance reservations at (800) 278-4159 where you need to reference the IEEE/CMPT ASTR 2003 conference. ·
Enter their secure web site by clicking on the “Reserve A Room” button on the home page. Once on the secure site you must enter the Group Code: IEEIEEA in the field at the bottom of that page. You can also enter your Marriott Rewards Number if you have one.

Transportation Parking will cost $19-$24/day and since there are many restaurants and attractions within easy walking distance, you probably won’t need a car during the conference. We recommend using the Airport Express to / from the airport (SEA) and the hotel.

Airport Express by Grey Lines - http://www.graylineofseattle.com/airport.cfm At least every ½ hour from 5:20am to 10:50pm daily $8.50 one way, $14 round trip Tickets can be purchased - on line (4 days or more in advance) which are e-mailed to you - at the Gray Line of Seattle booths (located at the north and south ends of the baggage claim area) - from Airport Express drivers

Car Rental Companies

AVIS, HERTZ, and several other agencies have downtown offices less than a mile from the hotel. So renting a car only for the days you need to go beyond the downtown area will save you some money on both parking and the car rental. If you plan to rent a car downtown, please reserve in advance and confirm your pick-up and drop-off times with the rental agency.