Begins
Oct 1, 2003 at 7:00 am
|
Ends
Oct 3, 2003 at 5:00 pm
|
Location
Renaissance Seattle Hotel
515 Madison Street
Seattle,
WA
98104
USA
|
| Order Now Below |
 |
|
|
Event Details:
The IEEE/CPMT 2003 Workshop on Accelerated Stress Testing
ASTR
2003
Over the last few years,
Accelerated Stress Testing (AST) has been embraced by an ever widening
array of worldwide companies seeking to reconcile the need for the highest
quality product with the necessary push for early time-to-market. The
purpose of the AST Workshop is to share ideas on better ways of
accelerating and detecting hidden defects, flaws, and weaknesses in
electronic and electro-mechanical hardware that would result in failures
during usage. These techniques are focused on testing electronic hardware
to destruction limits and root cause investigation to determine the
physics-of-failure. The goal of AST is to produce mature products at
market introduction and, in making it robust, the product can be screened
for manufacturing defects with high combined stresses (beyond end-use
specifications) for shorter lengths of time.
Topics include:
Advanced Approaches to AST
Electrodynamic vs. Repetitive Shock Vibration
Reliability Improvement Techniques
AST Data Collection/Analysis
Failure Analysis Techniques and Examples
Reliability Simulation and Modeling
Application of Physics of Failure Techniques
Stress Screening Techniques
AST Case Studies, including stress profiles
Stress other than temperature & vibration
Functional test During Stress Testing
AST Results on New Technologies
TUTORIALS: The all day tutorial program will be held on the first day of the Workshop and features well respected experts sharing their experiences and hard learned lessons. Two parallel sessions , Basic AST and Advanced AST Subjects, will ensure that experienced practitioners as well as those who are just entering the field will find useful and interesting presentations.
To pay by check, go to the ASTR 2003 web site to get the registration form.
|