Workshop on

Accelerated Stress Testing & Reliability

Sponsored by the IEEE/CPMT ASTR Committee and Technically co-sponsored by the IEEE Reliability Society

Oct 6 - 8, 2004   in   Chicago, Illinois

at  Holiday Inn Chicago-Mart Plaza

(Please ask for the "ASTR" rooms when making a reservation)

Over the last few years, Accelerated Stress Testing (AST) has been embraced by an ever widening array of worldwide companies seeking to reconcile the need for the highest quality product with the necessary push for early time-to-market. The purpose of the AST Workshop is to share ideas on better ways of accelerating and detecting hidden defects, flaws, and weaknesses in electronic and electro-mechanical hardware that would result in failures during usage. These techniques are focused on testing electronic hardware to destruction limits and root cause investigation to determine the physics-of-failure. The goal of AST is to produce mature products at market introduction and, in making it robust, the product can be screened for manufacturing defects with high combined stresses (beyond end-use specifications) for shorter lengths of time.

You may also wish to consider attending SAE International's new "Accelerated Test Methods for Ground and Aerospace Vehicle Development" seminar, which is being held in conjuction with the ASTR 2004 Workshop in Chicago, Illinois, on October 4 & 5, 2004.

For more information, download this SAE seminar flyer and follow this link to their web page.

Quick Links:

Paper Topics

Abstracts
Day 1 - Tutorials
Days 2 & 3 - Technical Sessions
Registration Forms
Speakers Info
Sponsors & Exhibit information 

PAPER TOPICS

Call for Papers and Tutorials

HAVE A TOPIC YOU WOULD LIKE TO DISCUSS? 

Please email John Proulx with your suggestions for an open forum panel discussion

View the ABSTRACTS

DAY 1 - TUTORIALS

Call for Papers and Tutorials

View the Schedule

The all day tutorial program will be held on the first day of the Workshop and features well respected experts sharing their experiences and hard learned lessons. Two parallel sessions , Basic AST and Advanced AST Subjects, will ensure that experienced practitioners as well as those who are just entering the field will find useful and interesting presentations.

Tutorial Topics

•  Failure analysis
•  Design of Experiments
•  AST Procedures
•  AST Equipment
•  Mechanical AST
•  Thermal AST
•  Overall AST planning and management
•  Reliability of component packaging and/or assembly and/or systems
•  AST for specific systems: optoelectronic packaging, rf devices
•  Reliability of Specific systems
•  Emerging technologies and future systems, such as MCM, System in Packaging, microsystems, nanotechnologies, and their reliability
•  Other AST issues

Please email proposal to chairs Alex Porter , Dave Rahe , and Anthony Chan.

DAYS 2 & 3 - TECHNICAL SESSIONS

View the Schedule

The two day workshop program will present new and innovative Accelerated Stress Testing techniques in use today. Past workshops featured speakers discussing their accomplishments in providing accelerated reliability testing for a wide range of products as well as failure analysis techniques and data analysis.

REGISTRATION FORM

Register by mail - please print & mail this PDF form

SPEAKERS INFO

Templates:

Paper/Presentation Deadlines:

SPONSORS

Registration Form and Exhibit Information

Many suppliers of AST equipment, instruments, and services will be present during the first two days.