IEEE/CPMT ASTR 2010 Workshop on Accelerated Stress Testing and Reliability

Keynote Title	Speaker	Affiliation
Bridging the Gap	Glen Griffiths	Director of Global Engineering Services, Hewlett-Packard
Constitutive Modeling and testing of Leaded and Unleaded Solders towards Failure and Reliability Analysis	Dr. Chandra Desai	Professor, Department of Civil Engineering and Engineering Mechanics, University of Arizona
System Health Management: Predicting Failure after Fielding a Product	Dr. Kai Goebel	Senior Scientist and Lead of the Prognostics Center of Excellence, NASA-Ames Research Center
Telecom Requirements for the Validation of Pb-Free Solder	Gary Hazard	Tellabs, Inc.
Life Testing and Its Role in the Probabilistic Design for Reliability of Electronic Systems.	Dr. Ephraim Suhir	University of California, Dept. of Electrical Engineering, Santa Cruz, CA
Tutorials
How to Design Accelerated Reliability Demonstration and Assurance Tests and Analyze Data Tests Using Physics of Failure Principles	Milena Krasich	Raytheon
Damage Mechanisms and On-Chip Interconnect Reliability: Current Practice, Recent Research on Accelerated Stress Testing, and Future Needs	Dr. David Read	Materials Reliability Division, National Institute of Standards and Technology
TBD	Dr. Ephraim Suhir	UC Santa Cruz
Scheduled Workshop Presentations
Abstract Title
Reliability Testing of Sn-3.5Ag Solder Joints for High Temperature Packaging Applications	Govindarajan Muralidharan	Oak Ridge National Laboratory
Accelerated Testing and On-Sun Failure of CPV Die-Attach	Nick Bosco	National Renewable Energy Laboratory
Achieving World Class LCD TV Reliability in a Low Cost Manufacturing Environment	Martin Shaw	Reliability Solutions Consulting Company
Acceleration Factors for Neutron Beam Soft Error Testing in Commercial and Avionic Environments	Charlie Slayman	Ops A La Carte
Engineering Design Analysis	Gary S Drake	US Army Materiel Systems Analysis Activity
Electrothermal-mechanical Modeling of Multi-chip Power Modules	F. Patrick McCluskey	University of Maryland
Design of Electric-Drive Vehicle Batteries for Long Life and Low Cost: Robustness to Geographic and Consumer-Usage	Kandler Smith	National Renewable Energy Laboratory
Knowledge-based Reliability Qualification and an Acceleration Model for Lead-free Solder Joint	Hwanki Jeon	Samsung Electronics
Advanced Modeling for Photovoltaic Durability	Dirk Jordan	National Renewable Energy Laboratory
Step-Stress Accelerated Degradation Testing for Photovoltaic Devices and Cells	Jinsuk Lee	National Renewable Energy Laboratory
New Army and DoD Reliability Scorecard	Marguerite Shepler	US Army Materiel Systems Analysis Activity
Field Return Rate Estimation in R&D Stage with an Indicator	Gürmen Kahramanoğlu	Vestel Electronics
Reliability Evaluation of Lead-free PTH Solder Joints through Long-term Thermal Cycling Test	Ivan Li	Wistron Corp.
Bridging the Gap: Accelerated degradation testing of engineering plastics and their use in predicting reliability of components under subsea pressure.	Amar Thiraviam	Teledyne ODI
What is HALT and what is NOT HALT?	Mike Silverman	Ops A La Carte
Accelerated Environmental Stress Testing in the PV World	David Dumbleton	Atlas Material Testing
High Temperature Stress Management duriing HALT	David Rahe	DLi Labs
Accelerated stress testing of grid-tied photovoltaic inverters	Mike Fife	PV Powered
A Methodology for Comparing Efficacy of Burn-In with HASA	Tom Peters	Qualmark
Improving Reliability by Moving From 810g Vibration Screening to HASS	Neill Doertenbach	Qualmark