Over the last few years, Accelerated Stress Testing has been embraced by an ever widening array of worldwide companies seeking to reconcile the need for the highest quality product with the necessary push for early time to market. Covered subjects range from lessons learned on complex systems down to component level reliability qualification.
CONFERENCE HIGHLIGHTS
TECHNICAL PRESENTATIONS (Oct 16-17): This year's program features presentations highlighting the utilization of advanced AST techniques in the design and manufacture of high quality components, modules and system level products. The advance program of Technical Presentations is shown below.
TUTORIALS (Oct 15): In-depth presentations highlighting current AST techniques in use within world class companies. Topics range from introduction to advanced techniques. The tutorial program is attached below.
DINNER SPEAKER (Oct 16): Mr. James F.
Clawson,
Mars Pathfinder Mission Assurance Manager and currently the
Manager of JPL's Reliability Engineering Office, speaking on the "Common
Sense" Mission Assurance program for Mars Pathfinder.
OPEN FORUM SESSION: Workshop attendees are
encouraged to participate by bringing up an issue or concern dealing with
AST. Each participant will be given 5 minutes and/or 1 viewgraph to discuss
their question or issue. This session is designed to be a free-flow,
informal exchange of ideas, questions, problems and success stories.
TOUR: There will be a scheduled tour of local electronic design and manufacturing facilities. Bus transportation will be provided.
EXHIBIT: Leading AST equipment and support vendors are scheduled to exhibit their products during the workshop.
LIMITED ATTENDANCE: To assure a free-flow of information in an informal environment, participation will be limited to 125 individuals.
TUTORIAL PROGRAM (Wednesday, Oct. 15, 8:00 am - 5:50 PM): Note: CEU's will be given to tutorial attendees by the IEEE.
4:50-5:50pm: Thermal Management, Measurements, and Analysis, Tony Mak, Allegro Microsystems
7:15-8:15am: Registration
8:15-8:30am: Introduction
8:30 a.m. - 9:00 a.m.: Practical Considerations for Thermal Testing, John Chappiro, JC
Systems
9:00-9:30am: Development Technology of Vibration
Accelerated Stress Testing Dr. Lev Klyatis
9:30-10:00am: HALT and HASS Techniques Used to Find
Defects Within Printed Circuit Boards Mike Silverman
Friday, October 17
8:30-9:00am: Environmental Stress Test and Control
Using Visual Basic T. Paul Parker and Dave York
9:00-9:30am: Sample Size Determination in AST H.A. Chan
and co-author
September 18, 1997