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2007 IEEE Instrumentation and Measurement Technology Conference May 1-3, 2007 Warsaw, Poland |
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2007 IEEE Instrumentation and Measurement Technology Conference May 1-3, 2007 Warsaw, Poland |
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All the sessions included in the IMTC 2007 Technical Program will be held on the Level 2 of Warsaw Marriott Hotel.
| Tuesday, May 1st, 2007 | ||||||
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| Time | Ballroom AB | Ballroom C | Ballroom D | Ballroom EF | Wawel-Syrena | Poster Hall |
| 8:30AM | Tu1: Plenary Opening Session | |||||
| 10:00AM | Coffee Break | |||||
| 10:30AM |
Tu2ab: Autonomous Sensors 7502, 7511, 7376, 7343, 7535 |
Tu2c: Imaging Systems and Techniques I 7195, 7696, 7467, 7423, 7127 |
Tu2d: Medical Measurements and Instrumentation I 7556, 7191, 7291, 7410, 7604 |
Tu2ef: Robotics & Industrial Monitoring 7453, 7480, 7489, 7114, 7111 |
Tu2ws: Mathematical Modeling of Signals and Systems 7090, 7171, 7080, 7258, 7628 |
Tu2p: Measurement Science & Education; Measurement Systems |
| 12:00PM | Lunch | |||||
| 2:00PM |
Tu3ab: Flow Sensors 7104, 7169, 7190, 7347, 7406 |
Tu3c: Imaging Systems and Techniques II 7193, 7659, 7199, 7598, 7380 |
Tu3d: Medical Measurements and Instrumentation II 7078, 7231, 7364, 7430, 7473 |
Tu3ef: Measurement for Telecommunication & Transportation 7613, 7474, 7584, 7586, 7564 |
Tu3ws: Digital Signal Processing 7545, 7223, 7345, 7067, 7033 |
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| 3:30PM | Coffee Break | |||||
| 4:00PM |
Tu4ab: Smart Sensors and Sensing Technology 7213, 7337, 7391, 7509, 7499 |
Tu4c: System Identification Applied to Solve Measurement Problems: nonlinear systems 7094, 7113, 7320, 7388, 7035 |
Tu4d: Medical Measurements and Instrumentation III 7098, 7287, 7390, 7449, 7064 |
Tu4ef: AC Metrology and Uncertainty Evaluations 7335, 7360, 7187, 7501, 7184 |
Tu4ws: Image Processing & Pattern Recognition 7294, 7554, 7459, 7338, 7549 |
Tu4p: Measurement-Data Acquisition |
| 5:30PM | Break | |||||
| 6:30PM | Welcome Reception | |||||
| 8:00PM | End of day | |||||
| Wednesday, May 2nd, 2007 | ||||||
| Time | Ballroom AB | Ballroom C | Ballroom D | Ballroom EF | Wawel-Syrena | Poster Hall |
| 8:30AM |
We1ab: Electrical Impedance Measurement Methods and Applications 7379, 7402, 7319, 7168, 7523 |
We1c: System Identification Applied to Solve Measurement Problems: transfer function modelling 7014, 7140, 7408, 7313, 7322 |
We1d: Measurement for Nanotechnology I 7016, 7117, 7165, 7211, 7354 |
We1ef: Fiber Optics Measurements 7660, 7452, 7082, 7077, 7352 |
We1ws: Inverse Problems & Signal Reconstruction 7362, 7146, 7636, 7038, 7595 |
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| 10:00AM | Coffee Break | |||||
| 10:30AM |
We2ab: Sensor Networks for Environmental Protection 7220, 7304, 7570, 7591, 7542 |
We2c: System Identification Applied to Solve Measurement Problems: (non)parametric methods 7131, 7019, 7382, 7092, 7145 |
We2d: Measurement for Nanotechnology II 7365, 7456, 7566, 7592 |
We2ef: Optical Measurements 7555, 7176, 7297, 7510, 7047 |
We2ws: Electrical & Power Measurements 1 7175, 7158, 7066, 7147, 7468 |
We2p: Measurement-Data Processing |
| 12:00PM | Lunch | |||||
| 2:00PM |
We3ab: Automated Testing and Monitoring 7551, 7605, 7148, 7680, 7060 |
We3c: System Identification Applied to Solve Measurement Problems: signal modelling 7108, 7037, 7044, 7330, 7062 |
We3d: Measurement Applications of Intelligent Data Processing I 7524, 7186, 7153, 7627, 7569 |
We3ef: Sensors & Transducers I 7572, 7557, 7357, 7393, 7503 |
We3ws: Electrical & Power Measurements II 7315, 7121, 7401, 7417, 7328 |
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| 3:30PM | Coffee Break | |||||
| 4:00PM | We4p: Plenary Poster Session | |||||
| 5:30PM | Break | |||||
| 6:30PM | Gala Dinner | |||||
| 9:00PM | End of day | |||||
| Thursday, May 3rd, 2007 | ||||||
| Time | Ballroom AB | Ballroom C | Ballroom D | Ballroom EF | Wawel-Syrena | Poster Hall |
| 8:30AM |
Th1ab: Reliable Design and Test of System-on-Chip - Instrumentation and Measurement Perspectives I 7181, 7284, 7135, 7139 |
Th1c: Instrumentation and Measurement Methods for Reliability, Testing and Fault Diagnosis 7247, 7305, 7072, 7396, 7170 |
Th1d: Measurement Applications of Intelligent Data Processing II 7286, 7441, 7665, 7413, 7498 |
Th1ef: Sensors & Transducers II 7639, 7210, 7637, 7235, 7444 |
Th1ws: Dielectric & Magnetic Measurements 7182, 7346, 7443, 7204, 7676 |
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| 10:00AM | Coffee Break | |||||
| 10:30AM |
Th2ab: Reliable Design and Test of System-on-Chip - Instrumentation and Measurement Perspectives II 7177, 7240, 7653, 7071 |
Th2c: WEB-based Educational Tools and Labs 7024, 7167, 7516, 7519, 7540 |
Th2d: Recent Developments in Microwave Measurements I 7537, 7309, 7515, 7394, 7123 |
Th2ef: A/D and D/A Converters I 7221, 7548, 7597, 7641, 7448 |
Th2ws: Mechanical Measurements & Material Analysis 7085, 7602, 7084, 7288, 7494 |
Th2p: Measurements of Physical Quantities |
| 12:00PM | Lunch | |||||
| 2:00PM |
Th3ab: Reliable Design and Test of System-on-Chip - Instrumentation and Measurement Perspectives III 7283, 7355, 7381, 7216, 7608 |
Th3c: Distributed Measurements Systems for Educational Labs 7137, 7149, 7325, 7331, 7544 |
Th3d: Recent Developments in Microwave Measurements II 7264, 7118, 7242, 7590, 7097 |
Th3ef: A/D and D/A Converters II 7115, 7368, 7397, 7446, 7483 |
Th3ws: Distributed Measurement Systems 7611, 7632, 7575, 7576 |
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| 3:30PM | Coffee Break | |||||
| 4:00PM |
Th4ab: Space - Frontiers of Measurement 7358, 7694 |
Th4c: Methodology of Teaching I&M 7612, 7635, 7329, 7615 |
Th4d: Recent Developments in Microwave Measurements III 7465, 7412, 7018, 7203 |
Th4ef: A/D and D/A Converters III 7032, 7471, 7022, 7644, 7439 |
Th4ws: Distributed Measurement Systems II 7522, 7475, 7675, 7373, 7600 |
Th4p: Measurement Applications |
| 5:30PM | Break | |||||
| 6:00PM | Special Events | |||||
| 9:00PM | End of day | |||||
