SPONSORS & ORGANIZERS

Sponsors & Patrons

Executive Committee

International Board of Advisors

Technical Program Committee

Sponsor

Patrons (Technical Sponsors)

Executive Committee

	Conference Chair Roman Z. MORAWSKI, Warsaw University of Technology, Poland
	Conference Co-Chair Andrzej MICHALSKI, Warsaw University of Technology, Poland
	Technical Program Chair Tomasz WOLIŃSKI, Warsaw University of Technology, Poland
	Technical Program Co-Chair Janusz MINDYKOWSKI, Gdynia Maritime University, Poland
	Technical Program Co-Chair Kim FOWLER, IEEE Instrumentation & Measurement Magazine, USA
	Finance Chair Janet LIDDIARD, IEEE Instrumentation & Measurement Society, USA
	Local Arrangement Chair Stanisław OSOWSKI, Warsaw University of Technology, Poland
	Local Arrangement Co-Chair Sue KINGSTON, IEEE Instrumentation & Measurement Society, USA
	Registration Chair Chris Dyer, Conference Catalysts, LLC, USA
	Social Events Chair Leszek JAROSZEWICZ, Military University of Technology, Poland
	Publicity Chair Ryszard ROMANIUK, Warsaw University of Technology, Poland
	Publicity Co-Chair Tomasz STARECKI, Warsaw University of Technology, Poland
	IT Support Chair Andrzej MIĘKINA, Warsaw University of Technology, Poland
	IT Support Co-Chair Tomasz CHOLEWO, IEEE Computational Intelligence Society, USA
	IT Support Co-Chair Slawomir ERTMAN, Warsaw University of Technology, Poland

International Board of Advisors

Andrzej BARWICZ, Measurement Microsystems A-Z, Inc., Quebec, Canada

Wojtek BOCK, University of Quebec at the Outaouais, Quebec, Canada

J. Max CORTNER, Guidant Corporation, USA

Pasquale DAPONTE, University of Sannio, Italy

Ryszard JACHOWICZ, Warsaw University of Technology, Poland

Janusz MROCZKA, Wroclaw University of Technology, Poland

Gabor PECELI, Budapest University of Technology and Economics, Hungary

Emil PETRIU, University of Ottawa, Ontario, Canada

Vincenzo PIURI, Milan University of Technology, Italy

Leo VAN BIESEN, Free University Brussel, Belgium

Romuald ZIELONKO, Gdansk University of Technology, Poland

Technical Program Committee

Cesare ALIPPI, Milan University of Technology, Italy

Olli AUMALA, Tampere University of Technology, Finland

Svetlana AVRAMOV-ZAMUROVIC, United States Naval Academy, Maryland, USA

Alain BAREL, Free University Brussel, Belgium

Lee BARFORD, Agilent Laboratories, USA

Andrzej BARWICZ, Measurement Microsystems A-Z, Inc., Quebec, Canada

Eric BENOIT, University of Savoie, France

Giovanni BETTA, University of Cassino, Italy

Jerome BLAIR, National Security Technologies LLC, USA

Wojtek BOCK, University of Quebec at the Outaouais, Quebec, Canada

Thierry BOSCH, Ecole Nationale Supérieure d'Electrotechnique, d'Electronique, d'Informatique, d'Hydraulique et des Télécommunications, France

Georg BRASSEUR, Graz University of Technology, Austria

David BRAUDAWAY, IEEE Liaison Delegate, USA

Piet BROERSEN, Delft University of Technology Library, The Netherlands

Zbigniew BRZÓZKA, Warsaw University of Technology, Poland

Marcantonio CATELANI, University of Siena, Italy

Paul CRILLY, University of Tennessee, USA

Brian CULSHAW, The University of Strathclyde, Scotland, United Kingdom

Joe CZAPSKI, AutoMeasure, Arlington, USA

Tamas DABOCZI, Budapest University of Technology and Economics, Hungary

Gabriele D’ANTONA, Milan University of Technology, Italy

Pasquale DAPONTE, University of Sannio, Italy

Sunil R. DAS, University of Ottawa, Ontario, Canada

Serge DEMIDENKO, Monash University, Malaysia

Michael J. DEVANEY, University of Missouri, Columbia, USA

Janko DRNOVSEK, University of Ljubljana, Slovenia

Abdulmotaleb EL SADDIK, University of Ottawa, Ontario, Canada

Christian EUGENE, Université Catholique de Louvain, Belgium

Peter FILIPSKI, National Research Council, Canada

Francisco J. FERRERO-MARTIN, Universidad de Oviedo, Spain

Kim R. FOWLER, Coolstream, LLC, Baltimore, USA

Norbert FURSTENAU, German Aerospace Center, Germany

Janusz GAJDA, AGH University of Science and Technology, Poland

Robert X. GAO, University of Massachusetts, Amherst, USA

George GIAKOS, University of Akron, USA

Frans GROEN, University of Amsterdam, The Netherlands

Voicu GROZA, University of Ottawa, Ontario, Canada

Konrad HEJN, Warsaw University of Technology, Poland

Gabor HORVATH, Budapest University of Technology and Economics, Hungary

Boguslaw JAROSZ, Carleton University of Ottawa, Ontario, Canada

Julian D. C. JONES, Heriot-Watt University, Scotland, United Kingdom

Izzet KALE, University of Westminster, United Kingdom

Kamiar J. KARIMI, The Boeing Company, USA

Heinz KOHLER, Karlsruhe University of Applied Sciences, Germany

Istvan KOLLAR, Budapest University of Technology and Economics, Hungary

Zygmunt KUSMIEREK, Technical University of Lodz, Poland

Theodore LAOPOULOS, Aristotle University of Thessaloniki, Greece

Edward LAYER, Cracow University of Technology, Poland

Kang LEE, National Institute of Standards and Technology, USA

Thomas LINNENBRINK, QDOT

Luca MARI, University "Carlo Cattaneo", Italy

Gilles MAURIS, University of Savoie, France

Janusz MINDYKOWSKI, Gdynia Maritime University, Poland

Devendra MISRA, University of Wisconsin-Milwaukee, Milwaukee, USA

Juergen MOHR, Forschungszentrum Karlsruhe, Germany

Subhas Chandra MUKHOPADHYAY, Massey University, New Zeland

Sergey MURAVYOV, Tomsk Polytechnic University, Russia

Claudio NARDUZZI, University of Padua, Italy

Jan OBRZUT,.National Institute of Standards and Technology, USA

Jerzy OLEDZKI, Warsaw University of Technology, Poland

Stanislaw OSOWSKI, Warsaw University of Technology, Poland

Andrzej PACUT, Warsaw University of Technology, Poland

Ramon PALLAS-ARENY, Technical University of Catalonia, Spain

Grzegorz PANKANIN, Warsaw University of Technology, Poland

Nohpill PARK, Oklahoma State University, Oklahoma, USA

Marco PARVIS,Torino University of Technology, Italy

Nick PAULTER, National Institute of Standards and Technology, USA

Gabor PECELI, Budapest University of Technology and Economics, Hungary

Emil PETRIU, University of Ottawa, Ontario, Canada

Rik PINTELON, Vrije Universiteit Brussel, Belgium

Vincenzo PIURI, Milan University of Technology, Italy

Sergio RAPUANO, University of Sannio, Italy

Yves ROLAIN, Vrije Universiteit Brussel, Belgium

Marek RUSIN, Warsaw University of Technology, Poland

Fabrizio RUSSO, University of Trieste, Italy

John SCHMALZEL, Rowan University, New Jersey, USA

Johan SCHOUKENS, Vrije Universiteit Brussel, Belgium

Milos SEDLACEK, Czech Technical University in Prague, Czech Republic

António da Cruz SERRA, Technical University of Lisbon, Portugal

Mel SIEGEL, Carnegie Mellon University, Pittsburgh, USA

Pedro SILVA GIRAO, Technical University of Lisbon, Portugal

Tadeusz SKUBIS, Silesian University of Technology, Poland

Gerard STENBAKKEN, National Institute of Standards and Technology, USA

Barna SZABADOS, McMaster University, Ontario, Canada

Jerzy SZABATIN, Warsaw University of Technology, Poland

Bogdan SZAFRANIEC, Agilent Technologies, USA

Reiner THOMAE, Technische Universität Ilmenau, Germany

Richard THORN, University of Derby, United Kingdom

Fumio TOJO, Yamabun Electronics Co. Ltd., Japan

Wladyslaw TORBICZ, Institute of Biocybernetics and Biomedical Engineering, Poland

Nicholas TUFILLARO, Agilent Technologies, USA

Leo VAN BIESEN, Free University Brussel, Belgium

Wendy VAN MOER, Vrije Universiteit Brussel, Belgium

Annamaria R. VARKONYI-KOCZY, Budapest University of Technology and Economics, Hungary

Brian WADELL, Guided Wave Solutions, USA

Kenzo WATANABE, Shizuoka University, Japan

Peter WIDE, Örebro University, Sweden

Wieslaw WINIECKI, Warsaw University of Technology, Poland

Tomasz R. WOLINSKI, Warsaw University of Technology, Poland

Mark YEARY, University of Oklahoma, USA

Reza ZOUGHI, University of Missouri-Rolla, Missouri, USA