T1: ADC AND DAC ARCHITECTURES, CALIBRATION, AND TEST

to be presented by Fang Xu on April 30 (Monday) 8:30 – 12:30 am

Contents

This session will focus primarily on ADC but will also include discussion of DACs. Major elements of the session include:

- Fundamentals of analog-to-digital (and digital-to-analog) conversion, sampling theory and its implications for data conversion.

- Conversion techniques and implications, basic ADC and DAC architectures and their inherent performance advantages and disadvantages.

- Converter characterization, how to assess ADC and DAC performance in terms standard parameters relevant to the intended application.

- Converter correction, how to improve the quality of the conversion process.

- Converter selection, what to consider when selecting a converter for various applications

Target audience

Engineers interested in selecting and qualifying ADCs and DACs for various applications.

Presenter’s biography

Fang Xu received the Docteur en Science from Université Paris Sud, France, in 1990. He is currently Senior Technologist at Teradyne. He holds multiple patents in instrumentation techniques and architectures. He has applied signal theory to first hand converter practices. He is a committee member of IEEE TC-10, contributing to  IEEE Std 1057 (on digitizing waveform recorders), IEEE Std 1241 (on ADCs), and IEEE Std 1658 (on DACs). His recent publication of “Algorithm to Remove Spectral Leakage, Close-in Noise, and Its Application to Converter Test” at IEEE IMTC 2006 received the best paper award of ADC forum in that conference.