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TECHNICAL PROGRAM MONDAY, 19 MAY 2003 TUTORIALS This will be the Tutorial Day at IMTC/03 and four presentations will be offered in a two-track program. The full-day program includes:
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Monday Morning 8:30 a.m. - "Low Level Measurement Techniques and Challenges from Superconductors to Insulators" - Instructor: Chris Armstrong, Keithley Instruments, Cleveland, Ohio USA The morning-long session will feature a review of the challenges faced when making difficult current and voltage measurements with emphasis on low level applications. The presentation focuses on the measurement process from choosing equipment to connecting your device for making optimal measurements of sensitive voltages and currents. This includes selecting the correct voltmeter for your application and understanding the differences, protecting your test system from voltage noise, setting up a test system for successful low current measurements. Measurement techniques to extend the limitations of your test system for both voltage and current are also discussed with live demonstrations. 8:30 a.m. - "Developing Real-Time Embedded Products (Part 1) - Instructor: Kim Fowler, Applied Physics Laboratory, Johns Hopkins University, Baltimore, Maryland USA The first segment will be a general introduction and general principles in design and development, illustrated with case studies and examples. Topics include systems engineering, documentation, human interface, packaging, grounding and shielding, circuit design, power, cooling, software, review and testing, production, procurement, maintenance and disposal. The second part of the morning session deals with noise and shielding and helps explain electromagnetic noise and how to design circuits and shielding to avoid it. Topics cover mechanisms of noise coupling, shielding, electrostatic discharge (ESD), general diagnostics, layout of signal traces, cables and enclosures. Monday Afternoon 1:30 p.m. - "Developing Real-Time Embedded Products (Part 2) - Instructor: Kim Fowler, Applied Physics Laboratory, Johns Hopkins University, Baltimore, Maryland USA The afternoon program covers specifics of design and development: Scheduling and Estimating Effort - The intricacies of scheduling and estimating design/development are covered with suggestions on improving estimating accuracy. Mission-Critical and Safety-Critical Systems - Here are general processes used in design and development of mission-critical and safety-critical systems and illustrated with two case studies, a satellite subsystem and a medical device. Build vs. Buy - The eternal question: do we build or do we buy? The choice is between custom development and purchasing components or subsystems for the final design. Issues include specifications, time, cost and resources. Fantastic Failures - Failure can be the source of useful information and can actually advance the state of the art. Presented will be several case studies of failures and one success story. What went wrong, what can be done to avoid the failures and how can we advance the state of the art. 1:30 p.m. - "Moisture and Density Sensing in Granular Solids Through Microwave Dielectric Measurements" - Organizer: Stuart O. Nelson, US Department of Agriculture, Athens, Georgia USA "Principles of Microwave Moisture and Density Sensing in Hygrosopic Granular Solids" (Stuart O. Nelson) "Density-Permittivity Relationships for Granular and Powdered Materials" (Stuart O. Nelson) "Calibration Methods for Multiparameter Microwave Sensors" (Samir Trabelsi) "Microstrip Antennas for Measurements on Granular Materials" (Omar Ramahi) "Microwave Moisture Sensing Instrument Prototype Development" (Mahmoud El Sabbagh) TUESDAY, WEDNESDAY, THURSDAY ADC FORUM The Defense Advanced Research Projects Agency (DARPA) and IEEE Instrumentation and Measurement Society's the Waveform Generation, Measurement and Analysis Committee (TC-10) are jointly promoting a Special Track: ADC Forum as part of IMtc/03. DARPA perceives a significant need to advance the state-of-the-art of ADC and DAC technology for military systems in order to better exploit burgeoning digital signal processing (DSP) technology. In fact, ADCs and DACs are THE BOTTLENECKS in many Defense electronic systems. DARPA will present an award (plaque) for the best paper presented in the ADC Forum. TC-10 has been developing IEEE standards for ADCs and related technology for several years. Common terminology and test methods are critical to the meaningful comparison of ADCs and DACs as well as to measuring progress. The result is three standards to date:
THE COMPLETE TECHNICAL PROGRAM The overall grid of the sessions schedule is available as: The details of the technical program is available as: |