Critical Current Densities of Isolated Grains and
Grain Boundaries in Coated Conductors
Marcus Weigand, Noel A. Rutter, John H.Durrell,
Susannah Speller, Gareth M.Hughes, Chris Grovenor
Abstract — We report on a new technique to isolate grain boundaries and single grains in YBa2Cu3O7-δ coated conductors using a focus edion beam microscope. For fields swept in plane across over from a regime where the critical current density is limited by the grain boundary to a regime where it is governed by the properties o fthe grain was found.
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