IEEE SENSORS 2003

Technical Program Committee

Lina Sarro, Technical Program Chair

William Hunt, Program co-Chair - Americas

Sukhan Lee, Program co-Chair – Asia and Pacific Rim

Bernhard Jakoby, Program co-Chair – Europe and Africa

Reviewer List

Gert Andersson, IMEGO, Sweden

Kris Baert, IMEC, Belgium

Minhang Bao, Fudan University, China

Marc Bendahan, Univeristy of Marseille, France

Ewald Benes, Technical University of Vienna, Austria

Carles Cane, CNM, Spain

Kukjin Chun, Seoul National University, Korea

Marina Cole, University of Warwick, UK

Dan Dascalu, IMT, Roemenia

Bernard Diem, CEA, France

Masayoshi Esashi, Tohoku University, Japan

Alan Evans, University of Southampton, UK

Gerald Gerlach Dresden, University of Technology, Germany

Bahram Ghodsian, Biogenik Technologies Inc., USA

Martin Gijs, EPFL, Switzerland

Pedro Girão, Lab Medidas Electricas, Portugal

Sheila Grant, University of Missouri-Columbia, USA

Anne-MarieGue, LASS, France

Gabor Harsanyi, Budapest University of Technology, Hungary

Peter Hauptmann, University of Magdeburg, Germany

Andreas Hierlemann, ETHZ, Switzerland

Star Huang, National Tsing Hua University, Taiwan

Qing-An Huang, South Eastern university, China

Ryszard Jachowicz, Warsaw University of Technology, Poland

Shoji Kawahito, Shizuoka University, Japan

Taesong Kim, KIST, Korea

Kevin Kornegay, Cornell University, USA

Jan Korvink, IMTEK, Germany

Milena Koudelka-Hep, University of Neuchatel, Switzerland

Anders Kristensen, MIC, Denmark

Reinhard Lerch, University of Erlangen-Nuremberg, Germany

Xinxin Li, SIMSIT, Shanghai, China

Chang Liu, University of Illinois Urbana-Champaign, USA

Anita Lloyd, Spetz Linköping University, Sweden

Kofi Makinwa, Delft University of Technology. The Netherlands

Andrew Mason, Michigan University, USA

Ryutaro Mayeda, National Institute of Advanced Industrial Science and Technology, Japan

Gerard Meijer, Delft University of Technology. The Netherlands

Chris Merveille, INASMET, Spain

Boris Mizaikoff, Georgia Institute of Technology, USA

Janos Mizsei, Budapest University of Technology, Hungary

Wilfried Mokwa, RWTH Aachen, Germany

Sang-Rok Oh, KIST, Korea

Robert Okojie, NASA-Gleen Cleveland, USA

Takahito Ono, Tohoku University, Japan

Ramón Pallás-Areny, Universitat Politécnica de Catalunya, Spain

Thomas Papakostas, Tekscan Inc., USA

Jaques Pistre, University of Bordeaux, France

Michael Rapp, Research Center Karlsruhe, Germany

Don Reago, US Army CECOM, USA

Pavel Ripka, Czech Technical University, Czech Republic

Chavdar Roumenin, University of Bucharest, Romenia

Giorgio Sberveglieri, University of Brescia, Italy

Oliver Schatz, Robert Bosch GmbH, Germany

Xia Shanhong, Chinese Academy of Science, China

Andrei Shkel, University of California Irvine, USA

Michael Shur, RPI, USA

Pietro Siciliano, IME-CNR, Italy

Priptal Singh, University of Villanova, USA

Hiroaki Suzuki, University of Tsukuba, Japan

Bill Tang, University of California Irvine, USA

Francis E. H. Tay, National university of Singapore, Singapore

Kazuhiko Tsutsumi, Mitsubishi, Japan

Gerald Urban, IMTEK, Germany

Chris Van Hoof, IMEC, Belgium

Michiel Vellekoop, Technical University Vienna, Austria

John Vig, US Army CECOM, USA

Denise Wilson, University of Washington, USA

Wojtek Wlodarski, RMIT University, Australia

Darrin Young, Case Western Reserve University, USA

Hans Zappe, IMTEK, Germany

Wendang Zhang, North-East china University of Science & Technology, China

Yinian Zhu, Nanyang Technological University, Singapore