SPONSORS & ORGANIZERS
International Board of Advisors
Patrons (Technical Sponsors)
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POLISH SOCIETY FOR MEASUREMENT, AUTOMATIC CONTROL AND ROBOTICS
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THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING |
WARSAW UNIVERSITY OF TECHNOLOGY Faculty of Electrical Engineering |
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AGILENT TECHNOLOGIES, INC. |
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Executive Committee
Conference Chair Roman Z. MORAWSKI, Warsaw University of Technology, Poland |
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Conference Co-Chair Andrzej MICHALSKI, Warsaw University of Technology, Poland |
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Technical Program Chair Tomasz WOLIŃSKI, Warsaw University of Technology, Poland |
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Technical Program Co-Chair Janusz MINDYKOWSKI, Gdynia Maritime University, Poland |
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Technical Program Co-Chair Kim FOWLER, IEEE Instrumentation & Measurement Magazine, USA |
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Finance Chair Janet LIDDIARD, IEEE Instrumentation & Measurement Society, USA |
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Local Arrangement Chair Stanisław OSOWSKI, Warsaw University of Technology, Poland |
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Local Arrangement Co-Chair Sue KINGSTON, IEEE Instrumentation & Measurement Society, USA |
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Registration Chair Chris Dyer, Conference Catalysts, LLC, USA |
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Social Events Chair Leszek JAROSZEWICZ, Military University of Technology, Poland |
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Publicity Chair Ryszard ROMANIUK, Warsaw University of Technology, Poland |
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Publicity Co-Chair Tomasz STARECKI, Warsaw University of Technology, Poland |
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IT Support Chair Andrzej MIĘKINA, Warsaw University of Technology, Poland |
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IT Support Co-Chair Tomasz CHOLEWO, IEEE Computational Intelligence Society, USA |
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IT Support Co-Chair Slawomir ERTMAN, Warsaw University of Technology, Poland |
International Board of Advisors
Andrzej BARWICZ, Measurement Microsystems A-Z, Inc., Quebec, Canada
Wojtek BOCK, University of Quebec at the Outaouais, Quebec, Canada
J. Max CORTNER, Guidant Corporation, USA
Pasquale DAPONTE, University of Sannio, Italy
Ryszard JACHOWICZ, Warsaw University of Technology, Poland
Janusz MROCZKA, Wroclaw University of Technology, Poland
Gabor PECELI, Budapest University of Technology and Economics, Hungary
Emil PETRIU, University of Ottawa, Ontario, Canada
Vincenzo PIURI, Milan University of Technology, Italy
Leo VAN BIESEN, Free University Brussel, Belgium
Romuald ZIELONKO, Gdansk University of Technology, Poland
Cesare ALIPPI, Milan University of Technology, Italy
Olli AUMALA, Tampere University of Technology, Finland
Svetlana AVRAMOV-ZAMUROVIC, United States Naval Academy, Maryland, USA
Alain BAREL, Free University Brussel, Belgium
Lee BARFORD, Agilent Laboratories, USA
Andrzej BARWICZ, Measurement Microsystems A-Z, Inc., Quebec, Canada
Eric BENOIT, University of Savoie, France
Giovanni BETTA, University of Cassino, Italy
Jerome BLAIR, National Security Technologies LLC, USA
Wojtek BOCK, University of Quebec at the Outaouais, Quebec, Canada
Thierry BOSCH, Ecole Nationale Supérieure d'Electrotechnique, d'Electronique, d'Informatique, d'Hydraulique et des Télécommunications, France
Georg BRASSEUR, Graz University of Technology, Austria
David BRAUDAWAY, IEEE Liaison Delegate, USA
Piet BROERSEN, Delft University of Technology Library, The Netherlands
Zbigniew BRZÓZKA, Warsaw University of Technology, Poland
Marcantonio CATELANI, University of Siena, Italy
Paul CRILLY, University of Tennessee, USA
Brian CULSHAW, The University of Strathclyde, Scotland, United Kingdom
Joe CZAPSKI, AutoMeasure, Arlington, USA
Tamas DABOCZI, Budapest University of Technology and Economics, Hungary
Gabriele D’ANTONA, Milan University of Technology, Italy
Pasquale DAPONTE, University of Sannio, Italy
Sunil R. DAS, University of Ottawa, Ontario, Canada
Serge DEMIDENKO, Monash University, Malaysia
Michael J. DEVANEY, University of Missouri, Columbia, USA
Janko DRNOVSEK, University of Ljubljana, Slovenia
Christian EUGENE, Université Catholique de Louvain, Belgium
Peter FILIPSKI, National Research Council, Canada
Francisco J. FERRERO-MARTIN, Universidad de Oviedo, Spain
Kim R. FOWLER, Coolstream, LLC, Baltimore, USA
Norbert FURSTENAU, German Aerospace Center, Germany
Janusz GAJDA, AGH University of Science and Technology, Poland
Robert X. GAO, University of Massachusetts, Amherst, USA
George GIAKOS, University of Akron, USA
Frans GROEN, University of Amsterdam, The Netherlands
Voicu GROZA, University of Ottawa, Ontario, Canada
Konrad HEJN, Warsaw University of Technology, Poland
Gabor HORVATH, Budapest University of Technology and Economics, Hungary
Boguslaw JAROSZ, Carleton University of Ottawa, Ontario, Canada
Julian D. C. JONES, Heriot-Watt University, Scotland, United Kingdom
Izzet KALE, University of Westminster, United Kingdom
Kamiar J. KARIMI, The Boeing Company, USA
Heinz KOHLER, Karlsruhe University of Applied Sciences, Germany
Istvan KOLLAR, Budapest University of Technology and Economics, Hungary
Zygmunt KUSMIEREK, Technical University of Lodz, Poland
Theodore LAOPOULOS, Aristotle University of Thessaloniki, Greece
Edward LAYER, Cracow University of Technology, Poland
Kang LEE, National Institute of Standards and Technology, USA
Thomas LINNENBRINK, QDOT
Luca MARI, University "Carlo Cattaneo", Italy
Gilles MAURIS, University of Savoie, France
Janusz MINDYKOWSKI, Gdynia Maritime University, Poland
Devendra MISRA, University of Wisconsin-Milwaukee, Milwaukee, USA
Juergen MOHR, Forschungszentrum Karlsruhe, Germany
Subhas Chandra MUKHOPADHYAY, Massey University, New Zeland
Sergey MURAVYOV, Tomsk Polytechnic University, Russia
Claudio NARDUZZI, University of Padua, Italy
Jan OBRZUT,.National Institute of Standards and Technology, USA
Jerzy OLEDZKI, Warsaw University of Technology, Poland
Stanislaw OSOWSKI, Warsaw University of Technology, Poland
Andrzej PACUT, Warsaw University of Technology, Poland
Ramon PALLAS-ARENY, Technical University of Catalonia, Spain
Grzegorz PANKANIN, Warsaw University of Technology, Poland
Nohpill PARK, Oklahoma State University, Oklahoma, USA
Marco PARVIS,Torino University of Technology, Italy
Nick PAULTER, National Institute of Standards and Technology, USA
Gabor PECELI, Budapest University of Technology and Economics, Hungary
Emil PETRIU, University of Ottawa, Ontario, Canada
Rik PINTELON, Vrije Universiteit Brussel, Belgium
Vincenzo PIURI, Milan University of Technology, Italy
Sergio RAPUANO, University of Sannio, Italy
Yves ROLAIN, Vrije Universiteit Brussel, Belgium
Marek RUSIN, Warsaw University of Technology, Poland
Fabrizio RUSSO, University of Trieste, Italy
John SCHMALZEL, Rowan University, New Jersey, USA
Johan SCHOUKENS, Vrije Universiteit Brussel, Belgium
Milos SEDLACEK, Czech Technical University in Prague, Czech Republic
António da Cruz SERRA, Technical University of Lisbon, Portugal
Mel SIEGEL, Carnegie Mellon University, Pittsburgh, USA
Pedro SILVA GIRAO, Technical University of Lisbon, Portugal
Tadeusz SKUBIS, Silesian University of Technology, Poland
Gerard STENBAKKEN, National Institute of Standards and Technology, USA
Barna SZABADOS, McMaster University, Ontario, Canada
Jerzy SZABATIN, Warsaw University of Technology, Poland
Bogdan SZAFRANIEC, Agilent Technologies, USA
Reiner THOMAE, Technische Universität Ilmenau, Germany
Richard THORN, University of Derby, United Kingdom
Fumio TOJO, Yamabun Electronics Co. Ltd., Japan
Wladyslaw TORBICZ, Institute of Biocybernetics and Biomedical Engineering, Poland
Nicholas TUFILLARO, Agilent Technologies, USA
Leo VAN BIESEN, Free University Brussel, Belgium
Wendy VAN MOER, Vrije Universiteit Brussel, Belgium
Annamaria R. VARKONYI-KOCZY, Budapest University of Technology and Economics, Hungary
Brian WADELL, Guided Wave Solutions, USA
Kenzo WATANABE, Shizuoka University, Japan
Peter WIDE, Örebro University, Sweden
Wieslaw WINIECKI, Warsaw University of Technology, Poland
Tomasz R. WOLINSKI, Warsaw University of Technology, Poland
Mark YEARY, University of Oklahoma, USA
Reza ZOUGHI, University of Missouri-Rolla, Missouri, USA